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Calibration of the Bistatic TanDEM-X Interferometer

Bachmann, Markus and Hueso Gonzalez, Jaime and Krieger, Gerhard and Schwerdt, Marco and Walter Antony, John and De Zan, Francesco (2012) Calibration of the Bistatic TanDEM-X Interferometer. VDE Verlag GmbH. European Conference on Synthetic Aperture Radar (EUSAR), 2012-04-23 - 2012-04-26, Nuremberg, Germany.

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The paper describes the Calibration of Baseline, Instrument Delays and the Absolute Height of the RawDEMs for the TanDEM-X Global DEM in terms of bi-static and interferometric aspects.

Document Type:Conference or Workshop Item (Speech)
Title:Calibration of the Bistatic TanDEM-X Interferometer
AuthorsInstitution or Email of Authors
Bachmann, MarkusUNSPECIFIED
Hueso Gonzalez, JaimeUNSPECIFIED
Krieger, GerhardUNSPECIFIED
Schwerdt, MarcoUNSPECIFIED
Walter Antony, JohnUNSPECIFIED
De Zan, FrancescoUNSPECIFIED
Date:25 April 2012
Refereed publication:Yes
Page Range:pp. 1-4
Publisher:VDE Verlag GmbH
Series Name:Proceedings of the European Conference on Synthetic Aperture Radar (EUSAR)
Keywords:Calibration, Interferometry, Bi-static, TanDEM-X
Event Title:European Conference on Synthetic Aperture Radar (EUSAR)
Event Location:Nuremberg, Germany
Event Type:international Conference
Event Dates:2012-04-23 - 2012-04-26
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Erdbeobachtung
DLR - Research theme (Project):R - Projekt TanDEM-X
Location: Oberpfaffenhofen
Institutes and Institutions:Microwaves and Radar Institute > Radar Concepts
Microwaves and Radar Institute
Microwaves and Radar Institute > Spaceborne SAR Systems
Deposited By: Markus Bachmann
Deposited On:07 Dec 2011 13:59
Last Modified:08 May 2014 23:22

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