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Mapping terrestrial impact craters with the TanDEM-X digital elevation model

Gottwald, Manfred and Thomas, Fritz and Breit, Helko and Schättler, Birgit and Harris, Alan (2015) Mapping terrestrial impact craters with the TanDEM-X digital elevation model. In: Special Paper 518: Large Meteorite Impacts and Planetary Evolution V GSA Special Papers, 518. Geological Society of America. pp. 177-211. ISBN 978-0-8137-2518-5.

Full text not available from this repository.

Abstract

The TanDEM-X mission generates a global digital elevation model (DEM) with unprecedented properties. We use it for mapping confirmed terrestrial impact craters as listed in the Earth Impact Database. Both for simple and complex craters detailed investigations of the morphology of the particular structure and of the surrounding terrain can be performed.

Item URL in elib:https://elib.dlr.de/98576/
Document Type:Contribution to a Collection
Title:Mapping terrestrial impact craters with the TanDEM-X digital elevation model
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Gottwald, Manfredmanfred.gottwald (at) dlr.deUNSPECIFIED
Thomas, FritzDLR-IMFUNSPECIFIED
Breit, Helkodlr-imfUNSPECIFIED
Schättler, BirgitDLR-IMFUNSPECIFIED
Harris, AlanDLR-PFUNSPECIFIED
Date:September 2015
Journal or Publication Title:Special Paper 518: Large Meteorite Impacts and Planetary Evolution V
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Volume:518
DOI :10.1130/2015.2518
Page Range:pp. 177-211
Editors:
EditorsEmail
Osinski, Gordon R.University of Western Ontario
Kring, David A.Lunar and Planetary Institute
Publisher:Geological Society of America
Series Name:GSA Special Papers
ISBN:978-0-8137-2518-5
Status:Published
Keywords:terrestrial impact crater, TanDEM-X DEM, Earth Impact Database
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Erdbeobachtung
DLR - Research theme (Project):R - Vorhaben Spektrometrische Verfahren und Konzepte der Fernerkundung (old)
Location: Berlin-Adlershof , Oberpfaffenhofen
Institutes and Institutions:Institute of Planetary Research
Remote Sensing Technology Institute > SAR Signal Processing
Remote Sensing Technology Institute > Atmospheric Processors
Deposited By: Gottwald, Dr.rer.nat. Manfred
Deposited On:13 Oct 2015 13:11
Last Modified:09 Jan 2017 14:36

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