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Interferometric processing of TanDEM-X data

Fritz, Thomas and Rossi, Cristian and Yague-Martinez, Nestor and Rodriguez Gonzalez, Fernando and Lachaise, Marie and Breit, Helko (2011) Interferometric processing of TanDEM-X data. In: Proceedings of IGARSS 2011 (DOI: 10.1109/IGARSS.2011.6049701), pp. 2428-2431. IEEE Xplore. IGARSS 2011, 24-29 July 2011, Vancouver, BC, Canada. ISBN 978-1-4577-1003-2 ISSN 2153-6996

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Official URL: http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6034618

Abstract

Since July 2010, TerraSAR-X and TanDEM-X jointly acquire interferometric data. Starting their common commissioning phase with a so called pursuit monostatic configuration with 3 seconds time lag between the two passes, they were later put in a close formation in October 2010, acting since then as the first freely configurable bistatic SAR interferometer in space. All operational acquisitions were processed from instrument raw data to DEMs from day one of the data taking on by one single processing system: the Integrated TanDEM-X Processor (ITP) (see [1],[2]). Data take analysis, common parameter calculation, synchronization, bistatic focusing, filtering, co-registration, phase unwrapping and geocoding are all performed in one sequence inside this processor. This approach allows a high precision processing by passing all applied corrections and determined parameters from one step to the next. Specifically the geometric & phase accuracy and stability of the instruments, the processor and the auxiliary data (i.e. the millimetric precision of the baseline products) provide an unprecedented level of relative and absolute geometric accuracy in the bistatic operation. While many challenges of bistatic processing of the TanDEM-X data are encountered, the benefits of this single pass acquisition mode can be used to derive additional information from the data itself for further processing and calibration. In this paper, we will outline the bistatic interferometric processing steps of the ITP and focus on the aspects of geometric accuracy in DEM generation.

Item URL in elib:https://elib.dlr.de/83178/
Document Type:Conference or Workshop Item (UNSPECIFIED)
Title:Interferometric processing of TanDEM-X data
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Fritz, Thomasthomas.fritz (at) dlr.deUNSPECIFIED
Rossi, Cristiancristian.rossi (at) dlr.deUNSPECIFIED
Yague-Martinez, NestorNestor.Yague (at) dlr.deUNSPECIFIED
Rodriguez Gonzalez, Fernandofernando.rodriguezgonzales (at) dlr.deUNSPECIFIED
Lachaise, MarieMarie.Lachaise (at) dlr.deUNSPECIFIED
Breit, HelkoUNSPECIFIEDUNSPECIFIED
Date:2011
Journal or Publication Title:Proceedings of IGARSS 2011
Refereed publication:No
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Page Range:pp. 2428-2431
Publisher:IEEE Xplore
ISSN:2153-6996
ISBN:978-1-4577-1003-2
Status:Published
Keywords:synthetic aperture radar (SAR), interferometry, radargrammetry, DEM, TanDEM-X, interferometric processing, radar interferometry
Event Title:IGARSS 2011
Event Location:Vancouver, BC, Canada
Event Type:international Conference
Event Dates:24-29 July 2011
Organizer:IEEE
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Erdbeobachtung
DLR - Research theme (Project):R - Projekt TanDEM-X
Location: Oberpfaffenhofen
Institutes and Institutions:Remote Sensing Technology Institute > SAR Signal Processing
Deposited By: Fritz, Dr.rer.nat. Thomas
Deposited On:08 Jul 2013 10:40
Last Modified:08 May 2014 23:24

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