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Selection of numerical measures for pan-sharpening assessment

Makarau, Aliaksei and Palubinskas, Gintautas and Reinartz, Peter (2012) Selection of numerical measures for pan-sharpening assessment. IEEE Xplore. IGARSS 2012, 22-27 July 2012, Munich.

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Official URL: http://ieeexplore.ieee.org/Xplore/guesthome.jsp

Abstract

Different tasks of multispectral image analysis and processing require specific properties of input pan-sharpened multispectral data such as spectral and spatial consistency. Generally, the quantitative measures for pan-sharpening assessment were taken from other topics of image processing (e.g. image similarity indexes). All these measures are widely employed for this task but the applicability basis of these measures is not checked and proven. In this paper a comparison of pan-sharpening assessment measures for remote sensing is carried out on specially generated pan-sharpened images. Performed statistical analysis on the assessment measures allows to select the measures which are most sensitive to the pan-sharpened imagery quality and these measures are recommended for use.

Item URL in elib:https://elib.dlr.de/76285/
Document Type:Conference or Workshop Item (Speech)
Title:Selection of numerical measures for pan-sharpening assessment
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Makarau, AliakseiIMF-PBUNSPECIFIED
Palubinskas, GintautasIMF-PBUNSPECIFIED
Reinartz, PeterIMF-PBUNSPECIFIED
Date:July 2012
Refereed publication:No
Open Access:Yes
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Page Range:pp. 2264-2267
Publisher:IEEE Xplore
Status:Published
Keywords:Pan-sharpening, quality assessment
Event Title:IGARSS 2012
Event Location:Munich
Event Type:international Conference
Event Dates:22-27 July 2012
Organizer:IEEE GRSS
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Erdbeobachtung
DLR - Research theme (Project):R - Vorhaben hochauflösende Fernerkundungsverfahren
Location: Oberpfaffenhofen
Institutes and Institutions:Remote Sensing Technology Institute > Photogrammetry and Image Analysis
Deposited By: Makarau, Aliaksei
Deposited On:10 Jul 2012 07:33
Last Modified:31 Jul 2019 19:36

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