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Determination of dielectric material properties using passive MMW measurements for security applications

Dill, Stephan and Peichl, Markus and Süß, Helmut (2007) Determination of dielectric material properties using passive MMW measurements for security applications. In: Proceedings of SPIE 2007, 6548 (21), p. 9. SPIE Defence and Security Symposium 2007, 2007-04-09 - 2007-04-13, Orlando, FL (USA). ISBN 9780819466709.

Full text not available from this repository.

Abstract

Microwaves can be used to detect hidden objects behind optically opaque materials. Hence, the penetration capability through such materials is of fundamental importance. In order to characterize a material of interest in the microwave region, its permittivity should be known besides its physical structure. In many cases the permittivity is unknown, inaccurately known, or known for only specific frequencies. Also very often the range of values given in the literature can have a large variability for a specific situation. In this paper we describe a procedure to determine the permittivity from radiometric free space measurements of nearly arbitrary materials. A combined and advanced method of passive transmission and reflection measurements is outlined. The corresponding measurement assembly including the material sample and the necessary reference targets for almost environmentally independent measurements is illustrated. The advantage of this method is that large material samples like brick or wooden plates, and materials like textiles, which are hard to mount in a defined way in a waveguide, can be studied. An earlier presented method has been improved to obtain more accurate results. Some representative results for those MMW measurements are shown. The first attempts showed a satisfying performance.

Item URL in elib:https://elib.dlr.de/48844/
Document Type:Conference or Workshop Item (Speech, Paper)
Title:Determination of dielectric material properties using passive MMW measurements for security applications
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Dill, StephanUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Peichl, MarkusUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Süß, HelmutUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Date:11 April 2007
Journal or Publication Title:Proceedings of SPIE 2007
Refereed publication:No
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Volume:6548
Page Range:p. 9
Editors:
EditorsEmailEditor's ORCID iDORCID Put Code
International Society for Optical Engineering (SPIE), UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Series Name:Passive Millimeter-Wave Imaging Technology X
ISBN:9780819466709
Status:Published
Keywords:permittivity, measurement, radiometer, millimeter-wave, three-layer model, transmission, reflection
Event Title:SPIE Defence and Security Symposium 2007
Event Location:Orlando, FL (USA)
Event Type:international Conference
Event Dates:2007-04-09 - 2007-04-13
Organizer:SPIE
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Space (old)
HGF - Program Themes:W EO - Erdbeobachtung
DLR - Research area:Space
DLR - Program:W EO - Erdbeobachtung
DLR - Research theme (Project):W - Projekt sicherheitsrelevante Erdbeobachtung (old)
Location: Oberpfaffenhofen
Institutes and Institutions:Microwaves and Radar Institute > Reconnaissance and Security
Microwaves and Radar Institute
Deposited By: Dill, Stephan
Deposited On:18 Jun 2007
Last Modified:27 Apr 2009 13:51

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