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Surface Tension Measurement of molten silicon by the oscillating drop method using electromagnetic levitation.

Przyborowski, M. and Hibiya, T. and Eguchi, M. and Egry, I. (1995) Surface Tension Measurement of molten silicon by the oscillating drop method using electromagnetic levitation. Journal of Crystal Growth 151 (1995), pp. 60-65.

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Item URL in elib:https://elib.dlr.de/41052/
Document Type:Article
Additional Information: LIDO-Berichtsjahr=1995,
Title:Surface Tension Measurement of molten silicon by the oscillating drop method using electromagnetic levitation.
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Przyborowski, M.UNSPECIFIEDUNSPECIFIED
Hibiya, T.Fundamental Research Laboratories, JapanUNSPECIFIED
Eguchi, M.Fundamental Research Laboratories, JapanUNSPECIFIED
Egry, I.UNSPECIFIEDUNSPECIFIED
Date:1995
Journal or Publication Title:Journal of Crystal Growth 151 (1995)
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:Yes
Page Range:pp. 60-65
Status:Published
HGF - Research field:UNSPECIFIED
HGF - Program:Space (old)
HGF - Program Themes:W EO - Erdbeobachtung
DLR - Research area:UNSPECIFIED
DLR - Program:W EO - Erdbeobachtung
DLR - Research theme (Project):UNSPECIFIED
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Physics in Space > Institute of Space Simulation
Deposited By: DLR-Beauftragter, elib
Deposited On:02 Apr 2006
Last Modified:27 Apr 2009 11:33

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