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Simulation model for the scanning of surfaces by mechanical profiling systems.

Kratz, F. (1995) Simulation model for the scanning of surfaces by mechanical profiling systems. QM 95 "International Seminar on Quantitative Microscopy", Braunschweig, 04.-05.10.1995.

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Item URL in elib:https://elib.dlr.de/29258/
Document Type:Conference or Workshop Item (Speech)
Additional Information: LIDO-Berichtsjahr=1995,
Title:Simulation model for the scanning of surfaces by mechanical profiling systems.
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Kratz, F.UNSPECIFIEDUNSPECIFIED
Date:1995
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Status:Published
Event Title:QM 95 "International Seminar on Quantitative Microscopy", Braunschweig, 04.-05.10.1995
HGF - Research field:UNSPECIFIED
HGF - Program:other
HGF - Program Themes:other
DLR - Research area:UNSPECIFIED
DLR - Program:no assignment
DLR - Research theme (Project):L - no assignment (old)
Location: Braunschweig
Institutes and Institutions:Institute of Flight Control
Deposited By: DLR-Beauftragter, elib
Deposited On:02 Apr 2006
Last Modified:27 Apr 2009 07:21

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