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Interferometric High Precision Measurement of Surface Topography using image Analysis.

Ringel, G. and Hecker, P. and Miege, M. and Schmitt, D.R. (1995) Interferometric High Precision Measurement of Surface Topography using image Analysis. Symposium Bildverarbeitung in der industriellen Praxis, Steyer, 05.-06.09.1995.

Full text not available from this repository.


Item URL in elib:https://elib.dlr.de/29252/
Document Type:Conference or Workshop Item (Paper)
Additional Information: LIDO-Berichtsjahr=1995,
Title:Interferometric High Precision Measurement of Surface Topography using image Analysis.
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Ringel, G.UNSPECIFIEDUNSPECIFIED
Hecker, P.UNSPECIFIEDUNSPECIFIED
Miege, M.UNSPECIFIEDUNSPECIFIED
Schmitt, D.R.UNSPECIFIEDUNSPECIFIED
Date:1995
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Status:Published
Event Title:Symposium Bildverarbeitung in der industriellen Praxis, Steyer, 05.-06.09.1995
HGF - Research field:UNSPECIFIED
HGF - Program:other
HGF - Program Themes:other
DLR - Research area:UNSPECIFIED
DLR - Program:no assignment
DLR - Research theme (Project):L - no assignment (old)
Location: Braunschweig
Institutes and Institutions:Institute of Flight Control
Deposited By: DLR-Beauftragter, elib
Deposited On:02 Apr 2006
Last Modified:27 Apr 2009 07:21

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