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Digital material microstructures by means of tomography for simulation models

Bartsch, Marion (2018) Digital material microstructures by means of tomography for simulation models. ICAMS Seminar, 2018-03-01, Bochum, Deutschland.

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Properties of materials with a complex microstructure depend on the properties and the arrangement of the microstructural constituents. The presentation will show exemplarily for some materials how to derive 3-dimensional microstructure data on different length scales for the generation of numerical models, suitable for finite element analyses. For different length scales two methods are utilized - non-destructive X-ray tomography in the range from mm to μm and combined sequential focused ion beam (FIB) ablation and scanning electron microscopy in the submicron range.

Item URL in elib:https://elib.dlr.de/123619/
Document Type:Conference or Workshop Item (Speech)
Title:Digital material microstructures by means of tomography for simulation models
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Bartsch, MarionUNSPECIFIEDhttps://orcid.org/0000-0002-3952-2928UNSPECIFIED
Date:1 March 2018
Refereed publication:No
Open Access:No
Gold Open Access:No
In ISI Web of Science:No
Keywords:3D Microstructure, X-ray tomography, FIB slice and view, numerical models
Event Title:ICAMS Seminar
Event Location:Bochum, Deutschland
Event Type:national Conference
Event Date:1 March 2018
Organizer:Interdisciplinary Centre for Advanced Materials Simulation (ICAMS), Ruhr-Universität Bochum
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Aeronautics
HGF - Program Themes:propulsion systems
DLR - Research area:Aeronautics
DLR - Program:L ER - Engine Research
DLR - Research theme (Project):L - Virtual Engine and Validation methods (old)
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Research > Experimental and Numerical Methods
Deposited By: Bartsch, Dr.-Ing. Marion
Deposited On:29 Nov 2018 09:58
Last Modified:24 Apr 2024 20:27

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