Remote sensing of terrestrial impact craters: The TanDEM-X digital elevation model

Abstract

With the TanDEM-X digital elevation model (DEM) the terrestrial solid surface is globally mapped with unprecedented accuracy. TanDEM-X is a German X-band radar mission whose two identical satellites have been operated in single-pass interferometer configuration over several years. The acquired data are processed to yield a global DEM with 12 m independent posting and relative vertical accuracies of better than 2 m and 4 m in moderate and mountainous terrain, respectively. This DEM provides new opportunities for space-borne remote sensing studies of the entire sample of terrestrial impact craters. We have used the TanDEM-X DEM to investigate the current set of confirmed impact structures. For a subsample of the craters, including small, mid-sized and large structures, we compared the results with those from other DEMs. This quantitative analysis demonstrates the excellent quality of the TanDEM-X elevation data.