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Interferometric High Precision Measurement of Surface Topography using image Analysis.

Ringel, G. and Hecker, P. and Miege, M. and Schmitt, D.R. (1995) Interferometric High Precision Measurement of Surface Topography using image Analysis. Symposium Bildverarbeitung in der industriellen Praxis, Steyer, 05.-06.09.1995.

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Document Type:Conference or Workshop Item (Paper)
Additional Information: LIDO-Berichtsjahr=1995,
Title:Interferometric High Precision Measurement of Surface Topography using image Analysis.
Authors:
AuthorsInstitution or Email of Authors
Ringel, G.UNSPECIFIED
Hecker, P.UNSPECIFIED
Miege, M.UNSPECIFIED
Schmitt, D.R.UNSPECIFIED
Date:1995
Status:Published
Event Title:Symposium Bildverarbeitung in der industriellen Praxis, Steyer, 05.-06.09.1995
HGF - Research field:UNSPECIFIED
HGF - Program:other
HGF - Program Themes:other
DLR - Research area:UNSPECIFIED
DLR - Program:no assignment
DLR - Research theme (Project):L -- no assignement
Location: Braunschweig
Institutes and Institutions:Institute of Flight Control
Deposited By: elib DLR-Beauftragter
Deposited On:02 Apr 2006
Last Modified:27 Apr 2009 07:21

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