The TanDEM-X Radar Mission and terrestial impact structures

Abstract

The TanDEM-X mission has the goal to generate a Digital Elevation Model (DEM) with unprecedented quality. The complete final TanDEM-X DEM will be available by 2015. Because of its global coverage and very high accuracy the TanDEM-X DEM it is well suited for studies of the morphology and topography of simple and complex impact structures, together with the surrounding terrain. In a first approach we apply the TanDEM-X digital elevation data to the impact crater record of the exposed entries in the Earth Impact Database (EID) of the Planetary and Space Science Center at the University of New Brunswick, Canada. This presentation describes the current status of our research and illustrates several TanDEM-X DEM maps of known terrestrial impact craters.