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Detection of very small impurity particles in high-quality granulated sugar

Albers, Tobias and Peichl, Markus and Dill, Stephan (2015) Detection of very small impurity particles in high-quality granulated sugar. GeMic 2015, 2015-03-16 - 2015-03-18, Nuernberg, Germany. doi: 10.1109/GEMIC.2015.7107817.

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This paper is about first fundamental investigations whether radar technology can detect smallest impurities in the production of high-quality granulated sugar. Based on some theoretical considerations the sensitivity of microwave interaction with some reference targets and some typical impurity particles is explored using a measurement setup at predominantly W band (75 – 110 GHz). In dependence of various adjustable parameters like bi-static angle, polarization, and frequency band a selection of suitable measurement configurations is finally discussed.

Item URL in elib:https://elib.dlr.de/94753/
Document Type:Conference or Workshop Item (Poster)
Title:Detection of very small impurity particles in high-quality granulated sugar
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Peichl, MarkusUNSPECIFIEDhttps://orcid.org/0000-0003-0226-9786UNSPECIFIED
Dill, StephanUNSPECIFIEDhttps://orcid.org/0000-0001-6048-1107UNSPECIFIED
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In ISI Web of Science:No
Keywords:Bi-static radar, relative permittivity, sugar, impurities, W band, incidence angle, polarization, food monitoring.
Event Title:GeMic 2015
Event Location:Nuernberg, Germany
Event Type:international Conference
Event Dates:2015-03-16 - 2015-03-18
Organizer:German Institute for Microwave and Antenna Technologies (IMA)
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Earth Observation
DLR - Research theme (Project):R - Security-relevant Earth Observation
Location: Oberpfaffenhofen
Institutes and Institutions:Microwaves and Radar Institute > Reconnaissance and Security
Deposited By: Albers, Tobias
Deposited On:20 Jan 2015 10:16
Last Modified:21 Jul 2023 12:03

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