elib
DLR-Header
DLR-Logo -> http://www.dlr.de
DLR Portal Home | Imprint | Privacy Policy | Contact | Deutsch
Fontsize: [-] Text [+]

Sat-based speedpath debugging using waveforms

Dehbashi, Mehdi and Fey, Görschwin (2014) Sat-based speedpath debugging using waveforms. IEEE European Test Symposium, Paderborn. DOI: 10.1109/ETS.2014.6847802

Full text not available from this repository.

Official URL: http://dx.doi.org/10.1109/ETS.2014.6847802

Abstract

A major concern in the design of high performance VLSI circuits is speedpath debugging. This is due to the fact that timing variations induced by process variations and environmental effects are increasing as the size of VLSI circuits is shrinking. In this paper, a speedpath debugging approach based on Boolean Satisfiability (SAT) is proposed. The approach takes waveforms of the signals of a circuit into account. Waveforms and their propagation are encoded using SAT. Also, timing variation models for slowdown and speedup of each gate are incorporated into the model. The whole timing variation is controlled by a unit called variation control. Having an Erroneous Trace (ET) due to timing variation, our debug engine automatically finds potential failing speedpaths. The experimental results on ISCAS benchmarks show efficiency and diagnosis accuracy of our approach. The approach can also localize potential failing speedpaths for the multiplier circuit c6288 that has a large number of paths. Keywords—automated debugging, speedpaths, waveforms, timing variation

Item URL in elib:https://elib.dlr.de/93135/
Document Type:Conference or Workshop Item (Speech)
Title:Sat-based speedpath debugging using waveforms
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Dehbashi, MehdiUNSPECIFIEDUNSPECIFIED
Fey, GörschwinUNSPECIFIEDUNSPECIFIED
Date:11 December 2014
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
DOI :10.1109/ETS.2014.6847802
Page Range:pp. 63-68
Status:Published
Keywords:Debugging, Formal Methods, Integrated Circuit
Event Title:IEEE European Test Symposium
Event Location:Paderborn
Event Type:international Conference
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Space Technology
DLR - Research area:Raumfahrt
DLR - Program:R SY - Technik für Raumfahrtsysteme
DLR - Research theme (Project):R - Core Avionics
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Fey, Görschwin
Deposited On:11 Dec 2014 11:17
Last Modified:17 Feb 2015 10:02

Repository Staff Only: item control page

Browse
Search
Help & Contact
Information
electronic library is running on EPrints 3.3.12
Copyright © 2008-2017 German Aerospace Center (DLR). All rights reserved.