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Near specular scatter analysis method with a new goniophotometer

Meyen, Stephanie and Sutter, Florian and Heller, Peter (2014) Near specular scatter analysis method with a new goniophotometer. SPIE Optics & Photonics, 2014-08-18 - 2014-08-21, San Diego, USA. doi: 10.1117/12.2061036.

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[img] PDF (New specular scatter analysis with goniophotmeter - Vortrag) - Only accessible within DLR


The challenge of improving component quality and reducing cost has focused the attention of the solar thermal power industry on reliable component characterization methods. Since the reflector plays a key role in the energy conversion chain, the analysis of its reflectance properties has become a lively discussed issue in recent years. State of the art measurement instruments for specular reflectance do not give satisfying results, because they do not resolve sufficiently the near specular scatter of possible low cost mirror material candidates. The measurement of the BRDF offers a better solution than the traditional approach of placing a detector in the specular reflected beam path. However, due to the requirement of high angular resolution in the range of 1 mrad (0.057°) or better and the challenge of measuring high dynamic differences between the specular peak and the scatter signal, typical commercial scanning goniophotometers capable of this are rare. These instruments also face the disadvantages of impractically long acquisition times and, to reach the high angular resolution, occupy a large space (several meters side length). We have taken on the appealing idea of a parallel imaging goniophotometer and designed a prototype based on this principle. A mirrored ellipsoid is used to redirect the reflected light coming from a sample towards a camera with a fisheye lens. This way the complete light distribution is captured simultaneously. A key feature allows the distinction of the high intensity specular peak and the low intensity scatter. In this article we explain the prototype design and demonstrate its functionality based on comparison measurements done with a commercial scanning goniophotometer. We identify limitations related in part to the concept and in part to the specific prototype and suggest improvements. Finally we conclude that the concept is well suitable for the analysis of near specular scatter of mirror materials, although less adequate for the analysis of rough surfaces that require a full 180° view angle. Results obtained with this instrument are useful to evaluate the performance of a reflector material for a specific concentrating solar collector design and also serve in other applications that require near specular scatter analysis like degradation and soiling research.

Item URL in elib:https://elib.dlr.de/91810/
Document Type:Conference or Workshop Item (Speech)
Title:Near specular scatter analysis method with a new goniophotometer
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Sutter, FlorianUNSPECIFIEDhttps://orcid.org/0000-0002-2981-5807UNSPECIFIED
Heller, PeterUNSPECIFIEDhttps://orcid.org/0000-0002-6399-5346UNSPECIFIED
Date:18 August 2014
Refereed publication:No
Open Access:No
Gold Open Access:No
In ISI Web of Science:No
Keywords:reflectance measurement, near specular scatter, BRDF analysis, goniophotometer, metrological instrumentation
Event Title:SPIE Optics & Photonics
Event Location:San Diego, USA
Event Type:international Conference
Event Start Date:18 August 2014
Event End Date:21 August 2014
HGF - Research field:Energy
HGF - Program:Renewable Energies
HGF - Program Themes:Concentrating Solar Systems (old)
DLR - Research area:Energy
DLR - Program:E SF - Solar research
DLR - Research theme (Project):E - Qualification (old)
Location: Köln-Porz
Institutes and Institutions:Institute of Solar Research > Qualifizierung
Deposited By: Kruschinski, Anja
Deposited On:11 Nov 2014 14:00
Last Modified:24 Apr 2024 19:57

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