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Mystery behind Similarity Measures MSE and SSIM

Palubinskas, Gintautas (2014) Mystery behind Similarity Measures MSE and SSIM. In: 2014 IEEE International Conference on Image Processing (ICIP), pp. 575-579. IEEE Xplore. ICIP 2014, 27.-30. Okt. 2014, Paris, France. ISBN 978-1-4799-5750-7

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Abstract

Similarity or distance measures play an important role in various pattern recognition applications such as classification, clustering, change detection, information retrieval, energy minimization and optimization problems. We shall analyze theoretically the two most popular quality measures MSE and SSIM used in image processing by showing their origin, similarities/differences and advantages/drawbacks. Both measures depend on the same parameters: sample means, standard deviations and correlation coefficient. It is shown that SSIM originates from two Dice measures and thus inherit their main drawback - dependence on the absolute mean and standard deviation values. Similarly, MSE depends on the absolute standard deviation values. A new similarity measure Composite quality index based on Means, Standard deviations and Correlation coefficient (CMSC) is proposed inheriting advantages of the both measures but at the same time avoiding their drawbacks.

Item URL in elib:https://elib.dlr.de/91439/
Document Type:Conference or Workshop Item (Poster)
Title:Mystery behind Similarity Measures MSE and SSIM
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Palubinskas, GintautasGintautas.Palubinskas (at) dlr.deUNSPECIFIED
Date:October 2014
Journal or Publication Title:2014 IEEE International Conference on Image Processing (ICIP)
Refereed publication:Yes
Open Access:Yes
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Page Range:pp. 575-579
Editors:
EditorsEmail
IEEE, IEEEUNSPECIFIED
Publisher:IEEE Xplore
ISBN:978-1-4799-5750-7
Status:Published
Keywords:Similarity, distance, Euclidian, Dice, composite, correlation coefficient, quality index, image
Event Title:ICIP 2014
Event Location:Paris, France
Event Type:international Conference
Event Dates:27.-30. Okt. 2014
Organizer:IEEE
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Erdbeobachtung
DLR - Research theme (Project):R - Vorhaben hochauflösende Fernerkundungsverfahren
Location: Oberpfaffenhofen
Institutes and Institutions:Remote Sensing Technology Institute > Photogrammetry and Image Analysis
Deposited By: Palubinskas, Dr.math. Gintautas
Deposited On:06 Nov 2014 12:55
Last Modified:31 Jul 2019 19:48

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