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CMOS-TDI detector technology for reconnaissance application

Eckardt, Andreas and Reulke, Ralf and Jung, Melanie and Sengebusch, Karsten (2014) CMOS-TDI detector technology for reconnaissance application. In: Electro-Optical and Infrared Systems: Technology and Applications XI, 9249. SPIE Security & Defence 2014, 22.-24. Sep. 2014, Amsterdam, Niederlande.

Full text not available from this repository.

Abstract

The Institute of Optical Sensor Systems (OS) at the Robotics and Mechatronics Center of the German Aerospace Center (DLR) has more than 30 years of experience with high-resolution imaging technology. This paper shows the institute’s scientific results of the leading-edge detector design CMOS in a TDI (Time Delay and Integration) architecture. This project includes the technological design of future high or multi-spectral resolution spaceborne instruments and the possibility of higher integration. DLR OS and the Fraunhofer Institute for Microelectronic Circuits and Systems (IMS) in Duisburg were driving the technology of new detectors and the FPA design for future projects, new manufacturing accuracy and on-chip processing capability in order to keep pace with the ambitious scientific and user requirements. In combination with the engineering research, the current generation of space borne sensor systems is focusing on VIS/NIR high spectral resolution to meet the requirements on earth and planetary observation systems. The combination of large-swath and high-spectral resolution with intelligent synchronization control, fast-readout ADC (analog digital converter) chains and new focal-plane concepts opens the door to new remote-sensing and smart deep-space instruments. The paper gives an overview of the detector development status and verification program at DLR, as well as of new control possibilities for CMOS-TDI detectors in synchronization control mode.

Item URL in elib:https://elib.dlr.de/91301/
Document Type:Conference or Workshop Item (Speech)
Title:CMOS-TDI detector technology for reconnaissance application
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Eckardt, AndreasInstitut für Optische SensorsystemeUNSPECIFIED
Reulke, RalfHU BerlinUNSPECIFIED
Jung, MelanieFraunhofer IMSUNSPECIFIED
Sengebusch, KarstenEURECA Messtechnik GmbHUNSPECIFIED
Date:2014
Journal or Publication Title:Electro-Optical and Infrared Systems: Technology and Applications XI
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Volume:9249
Series Name:Proc. SPIE
Status:Published
Keywords:Reconnaissance ; Sensors ; Equipment and services ; CMOS-TDI, VNIR, backside thinned CMOS, very thin CMOS TDI detector, MTF, SNR, new detector architecture
Event Title:SPIE Security & Defence 2014
Event Location:Amsterdam, Niederlande
Event Type:international Conference
Event Dates:22.-24. Sep. 2014
Organizer:SPIE
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Erdbeobachtung
DLR - Research theme (Project):R - Vorhaben hochauflösende Fernerkundungsverfahren, R - Vorhaben Optische Sensorik - Theorie, Kalibration, Verifikation
Location: Berlin-Adlershof
Institutes and Institutions:Institute of Optical Sensor Systems
Deposited By: Eckardt, Andreas
Deposited On:27 Oct 2014 06:58
Last Modified:27 Oct 2014 06:58

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