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In-situ laser-induced contamination monitoring using long-distance microscopy

Wagner, Paul and Schröder, Helmut and Riede, Wolfgang (2014) In-situ laser-induced contamination monitoring using long-distance microscopy. In: Proceedings of SPIE - The International Society for Optical Engineering. SPIE Laser Damage 2014, 27.-30. Sep. 2014, Boulder, USA.

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Abstract

Operating high power space-based laser systems in the visible and UV range is problematic due to laser-induced contamination (LIC). In this paper LIC growth on high-reflective (HR) coated optics is investigated for UV irradiation of 355 nm with naphthalene as contamination material in the range of 10-5 mbar. The investigated HR optics were coated by different processes: electron beam deposition (EBD), magnetron sputtering (MS) or ion beam sputtering (IBS). In-situ observation of contamination induced damage was performed using a long distance microscope. Additionally the onset and evolution of deposit formation and contamination induced damage of optical samples was observed by in-situ laser-induced fluorescence and reflection monitoring. Ex-situ characterization of deposits and damage morphology was performed by differential interference contrast and fluorescence microscopy. It was found that contamination induced a drastic reduction of laser damage threshold compared to values obtained without contamination. Contamination deposit and damage formation was strongest on IBS followed by MS and smallest on EBD.

Item URL in elib:https://elib.dlr.de/91289/
Document Type:Conference or Workshop Item (Poster)
Title:In-situ laser-induced contamination monitoring using long-distance microscopy
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Wagner, Paulpaul.wagner (at) dlr.deUNSPECIFIED
Schröder, Helmuthelmut.schroeder (at) dlr.deUNSPECIFIED
Riede, WolfgangWolfgang.Riede (at) dlr.deUNSPECIFIED
Date:2014
Journal or Publication Title:Proceedings of SPIE - The International Society for Optical Engineering
Refereed publication:Yes
Open Access:Yes
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:No
Status:Accepted
Keywords:LIC, laser-induced contamination, contamination induced damage, high-reflective optics, coating techniques, long distance microscope, fluorescence, damage threshold
Event Title:SPIE Laser Damage 2014
Event Location:Boulder, USA
Event Type:international Conference
Event Dates:27.-30. Sep. 2014
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Aeronautics
HGF - Program Themes:fixed-wing aircraft
DLR - Research area:Aeronautics
DLR - Program:L AR - Aircraft Research
DLR - Research theme (Project):L - Laser Research and Technology
Location: Stuttgart
Institutes and Institutions:Institute of Technical Physics > Active Optical Systems
Deposited By: Wagner, Paul
Deposited On:16 Dec 2014 16:18
Last Modified:31 Jul 2019 19:48

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