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Spatially Resolved Thermal Conductivity Measurements Using a Thermoreflectance Microprobe

Neubrand, A. and Dadda, J. and Müller, E. and Perlt, S. and Höche, T. (2013) Spatially Resolved Thermal Conductivity Measurements Using a Thermoreflectance Microprobe. Journal of Electronic Materials, 42 (7), pp. 2165-2171. Springer. DOI: 10.1007/s11664-013-2563-6 ISSN 0361-5235

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Abstract

A transient thermoreflectance technique capable of creating maps of the outof-plane thermal conductivity of materials with spatial resolution of 5 µm is presented. The applied oncontact optical microprobe uses a thin reflective metal film as temperature transducer and heat reservoir. The parameters of the experimental setup guarantee that the heat flow is one dimensional. Thus, relatively simple mathematical relations can be used to extract the thermal conductivity from the recorded signal shape, which is important for thermal conductivity maps with high pixel count. For reference materials (soda-lime glass and PbTe), the determined thermal conductivities were in good agreement with bulk values, indicating a typical measurement uncertainty of 10%. For low-conductivity substrates, the measuring scheme is relatively insensitive to thermal interface resistance. Thermal conductivity maps of lead-antimony-silver-tellurium surfaces showed distinct features which could be correlated with optical surface micrographs. The local conductivity fluctuations can possibly be attributed to local changes in chemical composition and secondary phase formation.

Item URL in elib:https://elib.dlr.de/85746/
Document Type:Article
Title:Spatially Resolved Thermal Conductivity Measurements Using a Thermoreflectance Microprobe
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Neubrand, A.Fraunhofer-Institut für Werkstoffmechanik, 79108 Freiburg, Wöhlerstr. 11UNSPECIFIED
Dadda, J.German Aerospace Center, Institute of Materials Research, Köln, GermanyUNSPECIFIED
Müller, E.German Aerospace Center, Institute of Materials Research, Köln, GermanyUNSPECIFIED
Perlt, S.Leibniz-Institut für Oberflächenmodifizierung e. V., Permoserstr. 15, Leipzig, GermanyUNSPECIFIED
Höche, T.Fraunhofer Institute for Mechanics of Materials IWM, Walter-Hülse-Str. 1, 06120 Halle, GermanyUNSPECIFIED
Date:10 April 2013
Journal or Publication Title:Journal of Electronic Materials
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:Yes
Volume:42
DOI :10.1007/s11664-013-2563-6
Page Range:pp. 2165-2171
Publisher:Springer
ISSN:0361-5235
Status:Published
Keywords:Thermal conductivity, thermoreflectance, LAST, microanalysis
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Transport
HGF - Program Themes:Terrestrial Vehicles (old)
DLR - Research area:Transport
DLR - Program:V BF - Bodengebundene Fahrzeuge
DLR - Research theme (Project):V - Project Fahrzeugenergiesysteme III (old)
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Research > Thermoelectric Materials and Systems
Deposited By: Zabrocki, Dr. Knud
Deposited On:27 Nov 2013 14:42
Last Modified:27 Nov 2013 14:42

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