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Dehbashi, Mehdi and Fey, Görschwin (2012) Automated post-silicon debugging of failing speedpaths. Asian Test Symposium (ATS), 2012-11-19 - 2012-11-22, Niigata, Japan. doi: 10.1109/ATS.2012.42.
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Official URL: http://dx.doi.org/10.1109/ATS.2012.42
| Item URL in elib: | https://elib.dlr.de/84411/ | ||||||||||||
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| Document Type: | Conference or Workshop Item (Speech) | ||||||||||||
| Title: | Automated post-silicon debugging of failing speedpaths | ||||||||||||
| Authors: |
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| Date: | 2012 | ||||||||||||
| Refereed publication: | Yes | ||||||||||||
| Open Access: | No | ||||||||||||
| Gold Open Access: | No | ||||||||||||
| In SCOPUS: | No | ||||||||||||
| In ISI Web of Science: | No | ||||||||||||
| DOI: | 10.1109/ATS.2012.42 | ||||||||||||
| Page Range: | pp. 13-18 | ||||||||||||
| Status: | Published | ||||||||||||
| Keywords: | EDA, post-silicon diagnosis, timing, integrated circuits | ||||||||||||
| Event Title: | Asian Test Symposium (ATS) | ||||||||||||
| Event Location: | Niigata, Japan | ||||||||||||
| Event Type: | international Conference | ||||||||||||
| Event Start Date: | 19 November 2012 | ||||||||||||
| Event End Date: | 22 November 2012 | ||||||||||||
| HGF - Research field: | Aeronautics, Space and Transport | ||||||||||||
| HGF - Program: | Space | ||||||||||||
| HGF - Program Themes: | other | ||||||||||||
| DLR - Research area: | Raumfahrt | ||||||||||||
| DLR - Program: | R - no assignment | ||||||||||||
| DLR - Research theme (Project): | R - no assignment | ||||||||||||
| Location: | Bremen | ||||||||||||
| Institutes and Institutions: | Institute of Space Systems > Avionics Systems | ||||||||||||
| Deposited By: | Fey, Görschwin | ||||||||||||
| Deposited On: | 26 Sep 2013 12:19 | ||||||||||||
| Last Modified: | 04 Jun 2024 14:46 |
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