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A Free Space Measurement Approach for Dielectric Material Characterization

Rocha, Leno S. and Junqueira, C. and Gambin, Ediana and Vicente, Alexandre N. and Culhaoglu, Ali Eren and Kemptner, Erich (2013) A Free Space Measurement Approach for Dielectric Material Characterization. IMOC 2013, 2013-08-04 - 2013-08-07, Rio de Janeiro.

Full text not available from this repository.

Abstract

A free space nondestructive dielectric material characterization method from an initial procedure, the TRL calibration, to the permittivity calculation by the NRW method, including the implemented software and its practical validation with specific materials, is presented.

Item URL in elib:https://elib.dlr.de/83186/
Document Type:Conference or Workshop Item (Speech)
Title:A Free Space Measurement Approach for Dielectric Material Characterization
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Rocha, Leno S.ITA, BrazilUNSPECIFIED
Junqueira, C.CTA, BrazilUNSPECIFIED
Gambin, EdianaCTA, BrazilUNSPECIFIED
Vicente, Alexandre N.Inst. of Criminology, BrazilUNSPECIFIED
Culhaoglu, Ali ErenDLRUNSPECIFIED
Kemptner, ErichDLRUNSPECIFIED
Date:4 August 2013
Refereed publication:No
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Status:Published
Keywords:material, characterization, microwaves, free space
Event Title:IMOC 2013
Event Location:Rio de Janeiro
Event Type:international Conference
Event Dates:2013-08-04 - 2013-08-07
Organizer:Centro de Estudos em Telecomunicações, Brazil
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Aeronautics
HGF - Program Themes:Aircraft Research (old)
DLR - Research area:Aeronautics
DLR - Program:L AR - Aircraft Research
DLR - Research theme (Project):L - Military Technologies (old)
Location: Oberpfaffenhofen
Institutes and Institutions:Microwaves and Radar Institute > Reconnaissance and Security
Deposited By: Kemptner, Dr.tech. Erich
Deposited On:10 Jul 2013 08:48
Last Modified:08 May 2014 23:18

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