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Dependency of SAR Image Structure Descriptors with Incidence Angle

Dumitru, Corneliu Octavian and Datcu, Mihai (2012) Dependency of SAR Image Structure Descriptors with Incidence Angle. SPACOMM 2012, 29 April – 4 May 2012, Chamonix, France. ISBN 978-1-61208-194-6

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Official URL: http://www.iaria.org/conferences2012/ProgramSPACOMM12.html


The interpretation of the structure in Synthetic Aperture Radar images depends by the used parameters and incidence angle. The evaluation is done on the high resolution SAR data and the interpretation is realized automatically. In this paper, we propose to study and asses the behavior of the primitive feature extracted methods for images of the same scene with 2-3 look angles covering the min-max range of the sensor. The tests are done on TerraSAR-X products High Resolution Spotlight mode at 3 m resolution and two sites were found that are appropriate for this. To identify the best features and appropriate incidence angle for them the Support Vector Machine and as a measure of the classification accuracy the precision –recall were considered. The precision-recall was computed first for all investigated features and after that the best were taken into account for the incidence angle evaluation.

Item URL in elib:https://elib.dlr.de/81544/
Document Type:Conference or Workshop Item (Speech)
Title:Dependency of SAR Image Structure Descriptors with Incidence Angle
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Date:2 May 2012
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In ISI Web of Science:No
Page Range:pp. 92-97
Keywords:SAR images; inicidence angle; features
Event Title:SPACOMM 2012
Event Location:Chamonix, France
Event Type:international Conference
Event Dates:29 April – 4 May 2012
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Erdbeobachtung
DLR - Research theme (Project):R - Vorhaben hochauflösende Fernerkundungsverfahren
Location: Oberpfaffenhofen
Institutes and Institutions:Remote Sensing Technology Institute > Photogrammetry and Image Analysis
Deposited By: Dumitru, Corneliu Octavian
Deposited On:08 Mar 2013 11:44
Last Modified:08 Mar 2013 11:44

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