Temporal behaviour of MOS-IRS instrument parameters and alternative verification methods

Abstract

The Modular Optoelectronic Scanner (MOS) on the Indian remote sensing satellite IRS-P3 has been working successfully in orbit for over 5 years. The charge-coupled devices (CCD) of the MOS instruments are subjected to high-energy solar radiation which degrades performance. Therefore, the observation of changes in device parameters such as temperature, dark current and illumination characteristics is necessary to correct the measured data and to maintain the sensor calibration. The analysis of these parameters is also valuable for obtaining insight into long-term behaviour of charge-coupled devices in space. This paper describes the variation of the MOS device parameters as well as preliminary results of measuring these parameters following the power supply malfunction in September 2000.