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Automated feature localization for hardware designs using coverage metrics

Malburg, Jan and Finder, Alexander and Fey, Görschwin (2012) Automated feature localization for hardware designs using coverage metrics. In: 2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC), pp. 941-946. Design Automation conference (DAC), San Francisco, CA, USA. ISBN 9781450311991 ISSN 0738-100X

Full text not available from this repository.

Official URL: http://dx.doi.org/10.1145/2228360.2228529


Item URL in elib:https://elib.dlr.de/77032/
Document Type:Conference or Workshop Item (Speech, Poster)
Title:Automated feature localization for hardware designs using coverage metrics
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Malburg, JanUNSPECIFIEDUNSPECIFIED
Finder, AlexanderUNSPECIFIEDUNSPECIFIED
Fey, GörschwinUNSPECIFIEDUNSPECIFIED
Date:2012
Journal or Publication Title:2012 49th ACM/EDAC/IEEE Design Automation Conference (DAC)
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:Yes
Page Range:pp. 941-946
Series Name:Design Automation Conference DAC
ISSN:0738-100X
ISBN:9781450311991
Status:Published
Keywords:Design understanding, digital circuit
Event Title:Design Automation conference (DAC)
Event Location:San Francisco, CA, USA
Event Type:international Conference
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:other
DLR - Research area:Raumfahrt
DLR - Program:R - no assignment
DLR - Research theme (Project):R - no assignment
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Fey, Görschwin
Deposited On:13 Sep 2012 10:18
Last Modified:18 Oct 2017 10:00

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