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Automated debugging from pre-silicon to post-silicon

Dehbashi, Mehdi and Fey, Görschwin (2012) Automated debugging from pre-silicon to post-silicon. IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, Tallinn, Estonia.

Full text not available from this repository.

Official URL: http://dx.doi.org/10.1109/DDECS.2012.6219082


Item URL in elib:https://elib.dlr.de/77031/
Document Type:Conference or Workshop Item (Speech, Paper)
Title:Automated debugging from pre-silicon to post-silicon
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Dehbashi, MehdiUNSPECIFIEDUNSPECIFIED
Fey, GörschwinUNSPECIFIEDUNSPECIFIED
Date:2012
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Page Range:pp. 324-329
Status:Published
Keywords:Debugging, digital circuit, hardware design
Event Title:IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems
Event Location:Tallinn, Estonia
Event Type:international Conference
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:other
DLR - Research area:Raumfahrt
DLR - Program:R - no assignment
DLR - Research theme (Project):R - no assignment
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Fey, Görschwin
Deposited On:13 Sep 2012 10:22
Last Modified:04 Dec 2012 09:20

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