Automated debugging from pre-silicon to post-silicon

Dehbashi, Mehdi and Fey, Görschwin (2012) Automated debugging from pre-silicon to post-silicon. IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012-04-18 - 2012-04-20, Tallinn, Estonia. doi: 10.1109/DDECS.2012.6219082.

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Official URL: http://dx.doi.org/10.1109/DDECS.2012.6219082

Item URL in elib:

https://elib.dlr.de/77031/

Document Type:

Conference or Workshop Item (Speech)

Title:

Automated debugging from pre-silicon to post-silicon

Authors:

Authors	Institution or Email of Authors	Author's ORCID iD	ORCID Put Code
Dehbashi, Mehdi	UNSPECIFIED	UNSPECIFIED	UNSPECIFIED
Fey, Görschwin	UNSPECIFIED	UNSPECIFIED	UNSPECIFIED

Date:

2012

Refereed publication:

Yes

Open Access:

Gold Open Access:

In SCOPUS:

In ISI Web of Science:

DOI:

10.1109/DDECS.2012.6219082

Page Range:

pp. 324-329

Status:

Published

Keywords:

Debugging, digital circuit, hardware design

Event Title:

IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems

Event Location:

Tallinn, Estonia

Event Type:

international Conference

Event Start Date:

18 April 2012

Event End Date:

20 April 2012

HGF - Research field:

Aeronautics, Space and Transport

HGF - Program:

Space

HGF - Program Themes:

other

DLR - Research area:

Raumfahrt

DLR - Program:

R - no assignment

DLR - Research theme (Project):

R - no assignment

Location:

Bremen

Institutes and Institutions:

Institute of Space Systems > Avionics Systems

Deposited By:

Fey, Görschwin

Deposited On:

13 Sep 2012 10:22

Last Modified:

05 Jun 2024 08:08

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