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Functional analysis of circuits under timing variations

Dehbashi, Mehdi and Fey, Görschwin and Roy, Kaushik and Raghunathan, Anand (2012) Functional analysis of circuits under timing variations. IEEE European Test Symposium (ETS), Annecy, France.

Full text not available from this repository.

Official URL: http://dx.doi.org/10.1109/ETS.2012.6233031


Item URL in elib:https://elib.dlr.de/77030/
Document Type:Conference or Workshop Item (Poster)
Title:Functional analysis of circuits under timing variations
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Dehbashi, MehdiUNSPECIFIEDUNSPECIFIED
Fey, GörschwinUNSPECIFIEDUNSPECIFIED
Roy, KaushikUNSPECIFIEDUNSPECIFIED
Raghunathan, AnandUNSPECIFIEDUNSPECIFIED
Date:2012
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Page Range:p. 177
Status:Published
Keywords:Timing variations, digital circuits, process variations, formal analysis
Event Title:IEEE European Test Symposium (ETS)
Event Location:Annecy, France
Event Type:Workshop
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:other
DLR - Research area:Raumfahrt
DLR - Program:R - no assignment
DLR - Research theme (Project):R - no assignment
Location: Bremen
Institutes and Institutions:Institute of Space Systems > Avionics Systems
Deposited By: Fey, Görschwin
Deposited On:13 Sep 2012 10:20
Last Modified:04 Oct 2016 12:50

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