Functional analysis of circuits under timing variations

Dehbashi, Mehdi and Fey, Görschwin and Roy, Kaushik and Raghunathan, Anand (2012) Functional analysis of circuits under timing variations. IEEE European Test Symposium (ETS), 2012-05-28 - 2012-06-01, Annecy, France. doi: 10.1109/ETS.2012.6233031.

Full text not available from this repository.

Official URL: http://dx.doi.org/10.1109/ETS.2012.6233031

Item URL in elib:

https://elib.dlr.de/77030/

Document Type:

Conference or Workshop Item (Poster)

Title:

Functional analysis of circuits under timing variations

Authors:

Authors	Institution or Email of Authors	Author's ORCID iD	ORCID Put Code
Dehbashi, Mehdi	UNSPECIFIED	UNSPECIFIED	UNSPECIFIED
Fey, Görschwin	UNSPECIFIED	UNSPECIFIED	UNSPECIFIED
Roy, Kaushik	UNSPECIFIED	UNSPECIFIED	UNSPECIFIED
Raghunathan, Anand	UNSPECIFIED	UNSPECIFIED	UNSPECIFIED

Date:

2012

Refereed publication:

Yes

Open Access:

Gold Open Access:

In SCOPUS:

In ISI Web of Science:

DOI:

10.1109/ETS.2012.6233031

Page Range:

p. 177

Status:

Published

Keywords:

Timing variations, digital circuits, process variations, formal analysis

Event Title:

IEEE European Test Symposium (ETS)

Event Location:

Annecy, France

Event Type:

Workshop

Event Start Date:

28 May 2012

Event End Date:

1 June 2012

HGF - Research field:

Aeronautics, Space and Transport

HGF - Program:

Space

HGF - Program Themes:

other

DLR - Research area:

Raumfahrt

DLR - Program:

R - no assignment

DLR - Research theme (Project):

R - no assignment

Location:

Bremen

Institutes and Institutions:

Institute of Space Systems > Avionics Systems

Deposited By:

Fey, Görschwin

Deposited On:

13 Sep 2012 10:20

Last Modified:

05 Jun 2024 08:39

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