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Tandem-X Mission - New Perspectives for the Inventory and Monitoring of Global Settlement Patterns

Esch, Thomas and Taubenböck, Hannes and Roth, Achim and Heldens, Wieke and Felbier, Andreas and Thiel, Michael and Schmidt, Martin and Müller, Andreas and Dech, Stefan (2012) Tandem-X Mission - New Perspectives for the Inventory and Monitoring of Global Settlement Patterns. Journal of Applied Remote Sensing, 6 (1), pp. 1-21. Society of Photo-optical Instrumentation Engineers (SPIE). DOI: 10.1117/1.JRS.6.061702 ISSN 1931-3195

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Abstract

TanDEM-X (TerraSAR-X add-on for Digital Elevation Measurement) is a German earth observa-tion mission collecting a total of two global coverages of very high resolution (VHR) synthetic ap-erture radar (SAR) X-band data with a spatial resolution of around three meters in the years 2011 and 2012. Therewith, the TanDEM-X mission (TDM) will provide a unique data set, which is com-plementary to existing global coverages based on medium (MR) or high resolution (HR) optical im-agery. This paper explores and demonstrates the capabilities of the TDM in terms of supporting the analysis and monitoring of global human settlement patterns. The basic methodology for a fully-operational detection and delineation of built-up areas from VHR SAR data is presented along with a description of the resulting geo-information product – the Urban Footprint (UF) mask – and the operational processing environment for the UF production. Moreover, potential follow-on analyses based on the intermediate products generated in the context of the UF analysis are introduced and discussed. The results of the study indicate the high potential of the TDM with respect to an analy-sis of urbanization patterns, peri-urbanization, spatio-temporal dynamics of settlement development as well as population estimation, vulnerability assessment and modeling of global change.

Item URL in elib:https://elib.dlr.de/76520/
Document Type:Article
Title:Tandem-X Mission - New Perspectives for the Inventory and Monitoring of Global Settlement Patterns
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Esch, ThomasThomas.Esch (at) dlr.deUNSPECIFIED
Taubenböck, Hanneshannes.taubenboeck (at) dlr.deUNSPECIFIED
Roth, AchimAchim.Roth (at) dlr.deUNSPECIFIED
Heldens, WiekeWieke.Heldens (at) dlr.deUNSPECIFIED
Felbier, AndreasAndreas.Felbier (at) dlr.deUNSPECIFIED
Thiel, MichaelMichael.Thiel (at) uni-wuerzburg.deUNSPECIFIED
Schmidt, MartinMartin.Schmidt (at) dlr.deUNSPECIFIED
Müller, Andreasandreas.mueller (at) dlr.deUNSPECIFIED
Dech, Stefanstefan.dech (at) dlr.deUNSPECIFIED
Date:4 October 2012
Journal or Publication Title:Journal of Applied Remote Sensing
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:Yes
Volume:6
DOI :10.1117/1.JRS.6.061702
Page Range:pp. 1-21
Publisher:Society of Photo-optical Instrumentation Engineers (SPIE)
Series Name:JARS Special Issue on €œAdvances in Remote Sensing for Monitoring Global Environmental Changes”
ISSN:1931-3195
Status:Published
Keywords:Urbanization, TanDEM-X, Global mapping, Settlement patterns, Automation
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Erdbeobachtung
DLR - Research theme (Project):R - Vorhaben Prozesse der Landoberfläche (old)
Location: Oberpfaffenhofen
Institutes and Institutions:German Remote Sensing Data Center
Deposited By: Esch, Dr.rer.nat. Thomas
Deposited On:05 Nov 2012 13:49
Last Modified:11 Apr 2019 08:46

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