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Characterisation of Wafers and Solar Cells using a novel High Power LED-based Photoluminescence (PL) Inspection System

Regehly, Martin and Penlington, Jaime and Zemke, Marco and Reulke, Ralf (2011) Characterisation of Wafers and Solar Cells using a novel High Power LED-based Photoluminescence (PL) Inspection System. 26th EU PVSEC, 2011-09-05 - 2011-09-09, Hamburg.

Full text not available from this repository.


Item URL in elib:https://elib.dlr.de/73664/
Document Type:Conference or Workshop Item (Poster)
Title:Characterisation of Wafers and Solar Cells using a novel High Power LED-based Photoluminescence (PL) Inspection System
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Regehly, MartinUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Penlington, JaimeUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Zemke, MarcoUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Reulke, RalfUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Date:2011
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Status:Published
Keywords:solar cell characterisation, inspection system, LED, photoluminescence, back-illuminated CCD Camera
Event Title:26th EU PVSEC
Event Location:Hamburg
Event Type:international Conference
Event Start Date:5 September 2011
Event End Date:9 September 2011
HGF - Research field:Energy
HGF - Program:other
HGF - Program Themes:E - no assignment
DLR - Research area:Energy
DLR - Program:E - no assignment
DLR - Research theme (Project):E - no assignment
Location: Berlin-Adlershof
Institutes and Institutions:Optical Information Systems
Deposited By: Dombrowski, Ute
Deposited On:11 Jan 2012 12:23
Last Modified:24 Apr 2024 19:39

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