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Advanced measurement techniques for industrial use

Kompenhans, Jürgen and Klein, Christian and Fey, Uwe and Stasicki, Boleslaw and Koop, Lars (2011) Advanced measurement techniques for industrial use. Seminar Dalian University of Technology, 2011-10-13, Dalian, China.

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Item URL in elib:https://elib.dlr.de/71946/
Document Type:Conference or Workshop Item (Speech)
Title:Advanced measurement techniques for industrial use
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Kompenhans, JürgenUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Klein, ChristianUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Fey, UweUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Stasicki, Boleslaw UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Koop, LarsUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Date:2011
Refereed publication:No
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Status:Published
Keywords:Pressure Sensitive Paint (PSP), Temperature Sensitive Paint (TSP), Microphone Array Technique (MAT), Video Stroboscope (QVT)
Event Title:Seminar Dalian University of Technology
Event Location:Dalian, China
Event Type:Other
Event Date:13 October 2011
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Aeronautics
HGF - Program Themes:Aircraft Research (old)
DLR - Research area:Aeronautics
DLR - Program:L AR - Aircraft Research
DLR - Research theme (Project):L - Flight Physics (old)
Location: Göttingen
Institutes and Institutions:Institute of Aerodynamics and Flow Technology > Experimental Methods
Deposited By: Micknaus, Ilka
Deposited On:30 Nov 2011 13:20
Last Modified:24 Apr 2024 19:37

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