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Determination of Ti3Al and TiAl lamellae thickness by means of STEM

Kelm, Klemens and Kabir, Rizviul and Chernova, Liudmila and Bartsch, Marion (2011) Determination of Ti3Al and TiAl lamellae thickness by means of STEM. In: MC 2011 Kiel Proceedings, 3, M5-P595. DGE – German Society for Electron Microscopy e.V. Germany. MC 2011, 28. August – 02. September 2011, Kiel, Deutschland. ISBN 978-3-00-033910-3.

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Abstract

TiAl alloys are nowadays maturing into application in aerospace industries. Most of these alloys used exhibit a so called “duplex” or “fully lamellar” microstructure, containing colonies of lamellar grains, exhibit the so called Blackburn relationship. We measured the lamellae thickness by means of STEM. The procedure allows, in contrast to most other techniques semi-automatic determination of lamellae thicknes by simutaneous phase discrimination at high lateral resolution.

Item URL in elib:https://elib.dlr.de/71777/
Document Type:Conference or Workshop Item (Poster)
Title:Determination of Ti3Al and TiAl lamellae thickness by means of STEM
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iD
Kelm, KlemensInstitute of Materials Research, German Aerospace Center, Linder Höhe, 51147 Cologne, GermanyUNSPECIFIED
Kabir, RizviulInstitute of Materials Research, German Aerospace Center, Linder Höhe, 51147 Cologne, GermanyUNSPECIFIED
Chernova, LiudmilaInstitute of Materials Research, German Aerospace Center, Linder Höhe, 51147 Cologne, GermanyUNSPECIFIED
Bartsch, MarionInstitute of Materials Research, German Aerospace Center, Linder Höhe, 51147 Cologne, GermanyUNSPECIFIED
Date:September 2011
Journal or Publication Title:MC 2011 Kiel Proceedings
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Volume:3
Page Range:M5-P595
Editors:
EditorsEmailEditor's ORCID iD
Jäger, WolfgangUNSPECIFIEDUNSPECIFIED
Kaysser, WolfgangUNSPECIFIEDUNSPECIFIED
Benecke, WolfgangUNSPECIFIEDUNSPECIFIED
Depmeier, WulfUNSPECIFIEDUNSPECIFIED
Gorb, StanislavUNSPECIFIEDUNSPECIFIED
Kienle, LorenzUNSPECIFIEDUNSPECIFIED
Mulisch, MariaUNSPECIFIEDUNSPECIFIED
Häußler, DietrichUNSPECIFIEDUNSPECIFIED
Lotnyk, AndreiyUNSPECIFIEDUNSPECIFIED
Publisher:DGE – German Society for Electron Microscopy e.V. Germany
ISBN:978-3-00-033910-3
Status:Published
Keywords:TiAl, STEM, lamellae spacing
Event Title:MC 2011
Event Location:Kiel, Deutschland
Event Type:international Conference
Event Dates:28. August – 02. September 2011
Organizer:DGE – German Society for Electron Microscopy e.V. Germany
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Aeronautics
HGF - Program Themes:Propulsion Systems (old)
DLR - Research area:Aeronautics
DLR - Program:L ER - Engine Research
DLR - Research theme (Project):L - Virtual Engine and Validation Methods (old)
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Research > Microanalysis
Deposited By: Kelm, Dr. Klemens
Deposited On:21 Nov 2011 13:07
Last Modified:21 Nov 2011 13:07

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