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Analysis of microstrip lines in multilayer structures of arbitrarily varying thickness

Dreher, A. and Ioffe, A. (2000) Analysis of microstrip lines in multilayer structures of arbitrarily varying thickness. IEEE Microwave and Guided Wave Letters, 10 (2), pp. 52-54.

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Abstract

A general approach to the full-wave analysis of microstrip lines in multilayer dielectrics of arbitrarily varying thickness is developed. It is based on the discrete mode matching technique (DMM) and uses a full-wave equivalent circuit for the stratified structure, which is simple to apply in a numerical procedure. As an example, the propagation constant of a microstrip line in the interface of two dielectrics as a function of different shape characteristics is computed.

Item URL in elib:https://elib.dlr.de/6780/
Document Type:Article
Additional Information: LIDO-Berichtsjahr=1999,
Title:Analysis of microstrip lines in multilayer structures of arbitrarily varying thickness
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Dreher, A.UNSPECIFIEDUNSPECIFIED
Ioffe, A.UNSPECIFIEDUNSPECIFIED
Date:2000
Journal or Publication Title:IEEE Microwave and Guided Wave Letters
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:Yes
Volume:10
Page Range:pp. 52-54
Status:Published
Keywords:arbitrarily shaped interface, conformal, discrete mode matching, DMM, microstrip lines, multilayer
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Space (old)
HGF - Program Themes:W KN - Kommunikation/Navigation
DLR - Research area:Space
DLR - Program:W KN - Kommunikation/Navigation
DLR - Research theme (Project):UNSPECIFIED
Location: Oberpfaffenhofen
Institutes and Institutions:Institute of Communication and Navigation
Deposited By: DLR-Beauftragter, elib
Deposited On:16 Sep 2005
Last Modified:06 Jan 2010 20:39

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