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Grundlagen der Raster- und Transmissionselektronenmikroskopie

Kelm, Klemens (2009) Grundlagen der Raster- und Transmissionselektronenmikroskopie. Vortrag auf einem Buehler-Präparationsworkshop, Köln-Porz-Wahnheide.

Full text not available from this repository.

Abstract

Einführung in die Grundlagen der Raster- und Transmissionselektronenmikroskopie unter besonderer Berücksichtigung der Kontrastmechanismen und der Probenpräparation

Item URL in elib:https://elib.dlr.de/61311/
Document Type:Conference or Workshop Item (Speech)
Title:Grundlagen der Raster- und Transmissionselektronenmikroskopie
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Kelm, KlemensDLRUNSPECIFIEDUNSPECIFIED
Date:25 November 2009
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Status:Published
Keywords:REM, TEM
Event Title:Vortrag auf einem Buehler-Präparationsworkshop
Event Location:Köln-Porz-Wahnheide
Event Type:Workshop
Organizer:Buehler und DLR
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Aeronautics
HGF - Program Themes:Propulsion Systems (old)
DLR - Research area:Aeronautics
DLR - Program:L ER - Engine Research
DLR - Research theme (Project):L - Turbine Technologies (old)
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Research > Microanalysis
Deposited By: Kelm, Dr. Klemens
Deposited On:07 Dec 2009 10:06
Last Modified:07 Dec 2009 10:06

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