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Potential & Seebeck Microprobe – Imaging of electrical and thermoelectric material properties on the microscale

Ziolkowski, P. and Karpinski, G. and Platzek, D. and Stiewe , C. and Müller, E. (2009) Potential & Seebeck Microprobe – Imaging of electrical and thermoelectric material properties on the microscale. DPG Frühjahrstagung, 22.-27. März 2009, Dresden.

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Recent developments turned the Potential & Seebeck Microprobe (PSM) into a powerful tool for electrical functional materials characterisation. A wide spectrum of applications has been demonstrated including thermoelectric cobalt antimonide and bismuth telluride films including nano-structured thick films. The principle involves a heated probe tip positioned at the surface of a sample coupled to a heat sink. The probe tip contains a thermocouple, the sample is connected to another thermo¬couple, together forming independent circuits containing the probe–sample contact. The sample is scanned by mechanically touching and again disconnecting the surface at each position. A rapidly sensing electronic contact detection prevents fragile thin films down to 1 µm and thinner from being damaged by the probe tip. The tip is heating up the sample in a micro-vicinity, forming a locally focused temperature gradient. By several measuring circuits, thermo-voltages and the temperature drop over the gradient region are recorded, yielding the local Seebeck coefficient. With an electrical current fed through, the potential profile over the sample is monitored. Micro-resolving images both of the Seebeck coefficient and the potential obtained in a single run provide information on functional effects of the distribution of chemical compo¬nents, phases, alloying elements, or dopants. The method is particularly helpful to study functionally segmented or graded materials. The facility is suitable for low resistivity materials which are difficult because of extremely low signals.

Item URL in elib:https://elib.dlr.de/61096/
Document Type:Conference or Workshop Item (Speech)
Title:Potential & Seebeck Microprobe – Imaging of electrical and thermoelectric material properties on the microscale
AuthorsInstitution or Email of AuthorsAuthor's ORCID iD
Ziolkowski, P.German Aerospace Center, Köln, GermanyUNSPECIFIED
Karpinski, G.German Aerospace Center, Köln, GermanyUNSPECIFIED
Platzek, D.Physics Technology – Development and Consulting (PANCO), D-56218 Mühlheim-Kärlich, GermanyUNSPECIFIED
Stiewe , C.German Aerospace Center, Köln, GermanyUNSPECIFIED
Müller, E.German Aerospace Center, Köln, GermanyUNSPECIFIED
Date:26 March 2009
Open Access:No
Gold Open Access:No
In ISI Web of Science:No
Keywords:thermoelectric measurement - Seebeck coefficient - functionally graded or segmented material
Event Title:DPG Frühjahrstagung
Event Location:Dresden
Event Type:national Conference
Event Dates:22.-27. März 2009
Organizer:Deutsche Physikalische Gesellschaft (DPG)
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Space (old)
HGF - Program Themes:W SY - Technik für Raumfahrtsysteme
DLR - Research area:Space
DLR - Program:W SY - Technik für Raumfahrtsysteme
DLR - Research theme (Project):W - Vorhaben SISTEC (old)
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Research > Thermoelectric Materials and Systems
Deposited By: Zabrocki, Dr. Knud
Deposited On:26 Nov 2009 10:07
Last Modified:26 Nov 2009 10:07

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