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Al-26 Diffusion Measurement in 2/1-Mullite by Means of Secondary Ion Mass Spectrometry

Fielitz, Peter and Borchardt, Günter and Schmücker, Martin and Schneider, Hartmut (2006) Al-26 Diffusion Measurement in 2/1-Mullite by Means of Secondary Ion Mass Spectrometry. Solid State Ionics, 177, pp. 493-496. Elsevier.

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Item URL in elib:https://elib.dlr.de/45896/
Document Type:Article
Title:Al-26 Diffusion Measurement in 2/1-Mullite by Means of Secondary Ion Mass Spectrometry
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Fielitz, PeterTU ClausthalUNSPECIFIEDUNSPECIFIED
Borchardt, GünterTU ClausthalUNSPECIFIEDUNSPECIFIED
Schmücker, MartinUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Schneider, HartmutUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Date:2006
Journal or Publication Title:Solid State Ionics
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:Yes
Volume:177
Page Range:pp. 493-496
Publisher:Elsevier
Status:Published
Keywords:Aluminium-Diffusion, Mullit, SIMS
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Aeronautics
HGF - Program Themes:Propulsion Systems (old)
DLR - Research area:Aeronautics
DLR - Program:L ER - Engine Research
DLR - Research theme (Project):L - Combustion Chamber Technologies (old)
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Research > Structural and Functional Ceramics
Deposited By: Schmücker, Dr.rer.nat.hab. Martin
Deposited On:06 Dec 2006
Last Modified:27 Apr 2009 13:17

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