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Particle Detection Properties of Charge Coupled Devices (CCDs)

Meier, M. M. and Schott, J. U. and Strauch, K. (1999) Particle Detection Properties of Charge Coupled Devices (CCDs). Radiation Measurements, 31, pp. 173-178.

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Item URL in elib:https://elib.dlr.de/4533/
Document Type:Article
Additional Information: LIDO-Berichtsjahr=1999,
Title:Particle Detection Properties of Charge Coupled Devices (CCDs)
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Meier, M. M.UNSPECIFIEDUNSPECIFIED
Schott, J. U.UNSPECIFIEDUNSPECIFIED
Strauch, K.UNSPECIFIEDUNSPECIFIED
Date:1999
Journal or Publication Title:Radiation Measurements
Refereed publication:No
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Volume:31
Page Range:pp. 173-178
Status:Published
Keywords:Charge coupled device (CCD), semiconductor detectors, threshold energy, dead layer, semiconductor junction, HZE-particles
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Space (old)
HGF - Program Themes:W FR - Forschung unter Weltraumbedingungen (old)
DLR - Research area:Space
DLR - Program:W FR - Forschung unter Weltraumbedingungen
DLR - Research theme (Project):UNSPECIFIED
Location: Köln-Porz
Institutes and Institutions:Institute of Aerospace Medicine
Deposited By: DLR-Beauftragter, elib
Deposited On:16 Sep 2005
Last Modified:06 Jan 2010 17:46

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