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Secondary Phase Instability in ZrO2-Doped Silicon Nitride During High-Temperature Testing

Braue, W. and Kleebe, H.J. and Goering, J. (1996) Secondary Phase Instability in ZrO2-Doped Silicon Nitride During High-Temperature Testing. In: 4th Euro Ceramics, 3, pp. 25-30. Gruppo Editoriale Faenza Editrice, Italien.

Full text not available from this repository.


Item URL in elib:https://elib.dlr.de/43177/
Document Type:Conference or Workshop Item (Paper)
Additional Information: LIDO-Berichtsjahr=1996,
Title:Secondary Phase Instability in ZrO2-Doped Silicon Nitride During High-Temperature Testing
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Braue, W.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Kleebe, H.J.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Goering, J.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Date:1996
Journal or Publication Title:4th Euro Ceramics
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Volume:3
Page Range:pp. 25-30
Publisher:Gruppo Editoriale Faenza Editrice, Italien
Status:Published
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Aeronautics
HGF - Program Themes:other
DLR - Research area:Aeronautics
DLR - Program:L TT - Triebwerkstechnologien
DLR - Research theme (Project):UNSPECIFIED
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Research
Deposited By: DLR-Beauftragter, elib
Deposited On:02 Apr 2006
Last Modified:27 Apr 2009 12:40

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