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Analytical Electron Microscopy of Reaction-Bonded SiC.

Das Chowdhury, K. and Carpenter, R.W. and Braue, W. (1992) Analytical Electron Microscopy of Reaction-Bonded SiC. In: 50th Annual Meeting of the Electron Microscopy Society of America, August 16-21, 1992, Boston/Ma., USA.

Full text not available from this repository.


Item URL in elib:https://elib.dlr.de/42681/
Document Type:Conference or Workshop Item (Paper)
Additional Information: LIDO-Berichtsjahr=1992,
Title:Analytical Electron Microscopy of Reaction-Bonded SiC.
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Das Chowdhury, K.UNSPECIFIEDUNSPECIFIED
Carpenter, R.W.UNSPECIFIEDUNSPECIFIED
Braue, W.UNSPECIFIEDUNSPECIFIED
Date:1992
Journal or Publication Title:50th Annual Meeting of the Electron Microscopy Society of America, August 16-21, 1992, Boston/Ma., USA
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Status:Published
HGF - Research field:UNSPECIFIED
HGF - Program:Aeronautics
HGF - Program Themes:other
DLR - Research area:UNSPECIFIED
DLR - Program:L TG - Querschnittstechnologien
DLR - Research theme (Project):UNSPECIFIED
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Research
Deposited By: DLR-Beauftragter, elib
Deposited On:02 Apr 2006
Last Modified:27 Apr 2009 12:24

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