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XPS analysis of the degradation of Nafion

Schulze, M. and Lorenz, M. and Wagner, N. and Gülzow, E. (1999) XPS analysis of the degradation of Nafion. Fresenius Journal of Analytical Chemistry, 365, pp. 106-113.

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Item URL in elib:https://elib.dlr.de/2386/
Document Type:Article
Additional Information: LIDO-Berichtsjahr=2000,
Title:XPS analysis of the degradation of Nafion
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Schulze, M.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Lorenz, M.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Wagner, N.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Gülzow, E.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Date:1999
Journal or Publication Title:Fresenius Journal of Analytical Chemistry
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:Yes
Volume:365
Page Range:pp. 106-113
Status:Published
HGF - Research field:Energy
HGF - Program:other
HGF - Program Themes:E - no assignment
DLR - Research area:Energy
DLR - Program:E - no assignment
DLR - Research theme (Project):UNSPECIFIED
Location: Stuttgart
Institutes and Institutions:Institute of Engineering Thermodynamics
Deposited By: DLR-Beauftragter, elib
Deposited On:16 Sep 2005
Last Modified:06 Jan 2010 15:03

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