Simulation-Based Testing of Embedded Software in Space Applications

Abstract

This paper deals with the software-in-the-loop test approach being developed by the consortium project SiLEST (DLR, TU-Berlin, IAV, FhG FIRST, Webdynamix). We present a layer structure of the control loop that allows components of the environment simulation to be used for hardware-in-the-loop and software-in-the-loop testing of embedded systems software. The approach is specifically designed to test software behaviour in disturbed operating conditions, such as in a harsh environment, for example. In space applications, intensive radiation can corrupt computations and stored data. In addition, electronic devices such as sensors age much faster than on earth so that changed sensor deviations must be expected. Much the same is true of numerous other embedded systems, e.g. in automotive applications. Here, too, the electronic components are exposed to extreme conditions (temperature) and are subject to ageing processes.