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Riede, W. and Gruenewald, K.M. (2002) Large-spot COIL irradiation of Ge samples. Boulder Damage Symposium, Boulder, Colorado, USA, 16-18 September 2002.
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Abstract
The large-spot out-of-band irradiation of Ge wafers and subsequent evaluation is discussed in this paper. The wafers were irradiated with a high-power, cw COIL system, operating at a wavelength of 1.315 µm. Damaging fluence values on the order of 1 kJ/cm2 were found for irradiation periods of several seconds. Thermal simulations were consistent with experimental findings. The damage morphology showed melt and microcrystallites. For sample evaluation, a compact modulation transfer function (MTF) test bench has been developed.
| Item URL in elib: | https://elib.dlr.de/2189/ | ||||||||||||
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| Document Type: | Conference or Workshop Item (Paper) | ||||||||||||
| Additional Information: | LIDO-Berichtsjahr=2003, | ||||||||||||
| Title: | Large-spot COIL irradiation of Ge samples | ||||||||||||
| Authors: |
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| Date: | 2002 | ||||||||||||
| Open Access: | No | ||||||||||||
| Gold Open Access: | No | ||||||||||||
| In SCOPUS: | No | ||||||||||||
| In ISI Web of Science: | No | ||||||||||||
| Status: | Published | ||||||||||||
| Keywords: | Keywords: Large-spot irradiation, Ge wafers, COIL, MTF test bench | ||||||||||||
| Event Title: | Boulder Damage Symposium, Boulder, Colorado, USA, 16-18 September 2002 | ||||||||||||
| Organizer: | SPIE | ||||||||||||
| HGF - Research field: | Energy | ||||||||||||
| HGF - Program: | Aeronautics | ||||||||||||
| HGF - Program Themes: | other | ||||||||||||
| DLR - Research area: | Energy | ||||||||||||
| DLR - Program: | L - no assignment | ||||||||||||
| DLR - Research theme (Project): | L - Laser Research and Technology (old) | ||||||||||||
| Location: | Stuttgart | ||||||||||||
| Institutes and Institutions: | Institute of Technical Physics | ||||||||||||
| Deposited By: | Eckel, Dr.rer.nat. Hans-Albert | ||||||||||||
| Deposited On: | 16 Sep 2005 | ||||||||||||
| Last Modified: | 06 Jan 2010 14:48 |
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