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Large-Spot COIL irradiation of Ge samples

Riede, W. and Grünewald, K. (2003) Large-Spot COIL irradiation of Ge samples. In: Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization, 4932, pp. 119-124. SPIE. Boulder Damage Symposium, Boulder CO, USA, 16.-18.9.2002. ISBN 0-8194-4727-7.

Full text not available from this repository.

Abstract

The large-spot out-of-band irradiation of Ge wafers and subsequent evaluation is discussed in this paper. The wafers were irradiated with a high-power, cw COIL system, operating at a wavelength of 1.315 µm. Damaging fluence values on the order of 1 kJ/cm^2 were found for irradiation periods of several seconds. Thermal simulations were consistent with experimental findings. The damage morphology showed melt and microcrystallites. For sample evaluation, a compact modulation transfer function (MTF) test bench has been developed.

Item URL in elib:https://elib.dlr.de/2167/
Document Type:Conference or Workshop Item (Paper)
Additional Information: LIDO-Berichtsjahr=2002,
Title:Large-Spot COIL irradiation of Ge samples
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Riede, W.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Grünewald, K.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Date:2003
Journal or Publication Title:Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Volume:4932
Page Range:pp. 119-124
Editors:
EditorsEmailEditor's ORCID iDORCID Put Code
Exarhos, Gregory J.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Guenther, Arthur H.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Kaiser, NorbertUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Lewis, Keith L.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Soileau, M. J.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Stolz, Christopher J.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Giesen, AdolfUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Weber, HorstUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Publisher:SPIE
Series Name:Proceedings of SPIE
ISBN:0-8194-4727-7
Status:Published
Keywords:Keywords: Large-spot irradiation, Ge wafers, COIL, MTF test bench
Event Title:Boulder Damage Symposium, Boulder CO, USA, 16.-18.9.2002
Organizer:SPIE
HGF - Research field:Energy
HGF - Program:Aeronautics
HGF - Program Themes:other
DLR - Research area:Energy
DLR - Program:L - no assignment
DLR - Research theme (Project):L - Laser Research and Technology (old)
Location: Stuttgart
Institutes and Institutions:Institute of Technical Physics
Deposited By: Eckel, Dr.rer.nat. Hans-Albert
Deposited On:16 Sep 2005
Last Modified:06 Jan 2010 14:46

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