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Ultrashort pulse damage of Si an Ge semiconductors

Allenspacher, P. and Riede, W. and Hüttner, B. (2003) Ultrashort pulse damage of Si an Ge semiconductors. In: Proceedings: Laser-Induced Damage in Optical Materials: 2002 and International Workshop on Laser Beam and Optics Characterization, 4932, pp. 358-365. SPIE. Boulder Damage Symposium, Boulder CO, USA, 16.-18.9.2002. ISBN 0-8194-4727-7.

Full text not available from this repository.

Abstract

An investigation of ultrashort pulse damage threshold of semiconductors (Si, Ge) has been carried out. As the source of radiation, a Clark CPA Ti:sapphire laser system (wavelength 775 nm) has been used. It produces laser pulses of 0.5 mJ pulse energy at 1 kHz repetition rate, providing a Gaussian-like beam profile. Compressor detuning allowed to vary the pulse duration from 150 fs to 20 ps. The laser damage thresholds were measured for this pulse duration range. The damage morphologies were investigated with various microscopic inspection techniques like Nomarski DIC, atomic force microscopy and white light interference microscopy.

Item URL in elib:https://elib.dlr.de/2166/
Document Type:Conference or Workshop Item (Paper)
Additional Information: LIDO-Berichtsjahr=2002,
Title:Ultrashort pulse damage of Si an Ge semiconductors
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Allenspacher, P.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Riede, W.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Hüttner, B.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Date:2003
Journal or Publication Title:Proceedings: Laser-Induced Damage in Optical Materials: 2002 and International Workshop on Laser Beam and Optics Characterization
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Volume:4932
Page Range:pp. 358-365
Editors:
EditorsEmailEditor's ORCID iDORCID Put Code
Exarhos, Gregory J.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Guenther, Arthur H.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Kaiser, NorbertUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Lewis, Keith L.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Soileau, M. J.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Stolz, Christopher J.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Giesen, AdolfUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Weber, HorstUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Publisher:SPIE
Series Name:Proceedings of SPIE
ISBN:0-8194-4727-7
Status:Published
Keywords:ultrashort laser pulse´, semiconductors, Ti:Sapphire laser, 1-on-1 LIDT, melting threshold
Event Title:Boulder Damage Symposium, Boulder CO, USA, 16.-18.9.2002
Organizer:SPIE
HGF - Research field:Energy
HGF - Program:Aeronautics
HGF - Program Themes:other
DLR - Research area:Energy
DLR - Program:L - no assignment
DLR - Research theme (Project):L - Laser Research and Technology (old)
Location: Stuttgart
Institutes and Institutions:Institute of Technical Physics
Deposited By: Eckel, Dr.rer.nat. Hans-Albert
Deposited On:16 Sep 2005
Last Modified:06 Jan 2010 14:46

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