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A Method to Characterize Resistive Sheets at Microwave Frequencies

Buchenau, Erik and Osipov, Andrey and Jagdhuber, Thomas and Becherer, Markus (2025) A Method to Characterize Resistive Sheets at Microwave Frequencies. IEEE Transactions on Microwave Theory and Techniques, 73 (11), pp. 9012-9021. IEEE - Institute of Electrical and Electronics Engineers. doi: 10.1109/TMTT.2025.3589790. ISSN 0018-9480.

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Item URL in elib:https://elib.dlr.de/215255/
Document Type:Article
Title:A Method to Characterize Resistive Sheets at Microwave Frequencies
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Buchenau, ErikUNSPECIFIEDhttps://orcid.org/0009-0005-4063-7393UNSPECIFIED
Osipov, AndreyUNSPECIFIEDhttps://orcid.org/0000-0001-8678-9652UNSPECIFIED
Jagdhuber, ThomasUNSPECIFIEDhttps://orcid.org/0000-0002-1760-2425UNSPECIFIED
Becherer, MarkusUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Date:24 July 2025
Journal or Publication Title:IEEE Transactions on Microwave Theory and Techniques
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:Yes
Volume:73
DOI:10.1109/TMTT.2025.3589790
Page Range:pp. 9012-9021
Publisher:IEEE - Institute of Electrical and Electronics Engineers
ISSN:0018-9480
Status:Published
Keywords:Carbon nanotubes (CNT), microwave measurements, radar absorbers, resistive sheets, Salisbury screen, sheet resistance
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Earth Observation
DLR - Research area:Raumfahrt
DLR - Program:R EO - Earth Observation
DLR - Research theme (Project):R - Security-relevant Earth Observation
Location: Oberpfaffenhofen
Institutes and Institutions:Microwaves and Radar Institute > Reconnaissance and Security
Deposited By: Buchenau, Erik
Deposited On:06 Aug 2025 09:15
Last Modified:28 Nov 2025 08:35

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