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Potential-Seebeck-Microprobe PSM: Measuring the Spatial Resolution of the Seebeck Coefficient and the Electric Potential

Platzek, Dieter and Karpinski, Gabriele and Stiewe, Christian and Drasar, Cestmir and Müller, Eckhard (2005) Potential-Seebeck-Microprobe PSM: Measuring the Spatial Resolution of the Seebeck Coefficient and the Electric Potential. In: Proc. 24th Int. Conf. on Thermoelectrics (ICT 2005), pp. 13-16. Institute of Electrical and Electronics Engineers, Inc.. ICT 2005 - 24th Int. Conf. on Thermoelectrics, 2005-06-19 - 2005-06-23, Clemson, SC (USA). ISBN 0-7803-9552-1 ISSN 1094-2734

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Official URL: http://ieeexplore.ieee.org

Abstract

Thermoelectric power generators are typically operating in a large temperature difference; indeed the properties of thermoelectric semiconductors vary with temperature. Thus the overall conversion efficiency is strongly dependent on spatial variations of the material properties according to the temperature profile along the entire thermoelectric generator element. Similarly, a functionally graded module is capable of accomplishing thermal sensors with linearised characteristics over a wide temperature range. The Seebeck-coefficient S is a measure of the electrically active components in a material. Different components in a single unit become visible by measuring the local S with a scanning thermoprobe. This applies accordingly for the electrical conductivity and therefore the behaviour of the material in a certain temperature gradient becomes predictable. A scanning Seebeck Microprobe has been combined with the measurement of the electric potential along the surface of semiconducting or metallic material. A heated probe tip is placed onto the surface of the sample under investigation, measuring the Seebeck coefficient. Using a specially designed sample holder, an AC current can be applied to the specimen, allowing for the detection of the voltage drop between one current contact and the travelling probe tip. This voltage is proportional to the electrical conductivity at the tip position. With this technique a spatially resolved imaging of the Seebeck coefficient as well as the electrical conductivity can be performed. Furthermore the electrical contact resistance between different materials becomes visible, e.g., in segmented thermoelectric or other devices.

Item URL in elib:https://elib.dlr.de/21418/
Document Type:Conference or Workshop Item (Speech, Paper)
Title:Potential-Seebeck-Microprobe PSM: Measuring the Spatial Resolution of the Seebeck Coefficient and the Electric Potential
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Platzek, DieterUNSPECIFIEDUNSPECIFIED
Karpinski, GabrieleUNSPECIFIEDUNSPECIFIED
Stiewe, ChristianUNSPECIFIEDUNSPECIFIED
Drasar, CestmirUniv. Pardubice, CZUNSPECIFIED
Müller, EckhardUNSPECIFIEDUNSPECIFIED
Date:November 2005
Journal or Publication Title:Proc. 24th Int. Conf. on Thermoelectrics (ICT 2005)
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Page Range:pp. 13-16
Editors:
EditorsEmail
Tritt, Terry M.UNSPECIFIED
Publisher:Institute of Electrical and Electronics Engineers, Inc.
ISSN:1094-2734
ISBN:0-7803-9552-1
Status:Published
Keywords:thermoelectric materials, Seebeck Micro Probe, SMP, Seebeck coefficient, spatial resolution, hot probe, inhomogeneity, electrical materials properties, semiconductors, metals
Event Title:ICT 2005 - 24th Int. Conf. on Thermoelectrics
Event Location:Clemson, SC (USA)
Event Type:international Conference
Event Dates:2005-06-19 - 2005-06-23
Organizer:Clemson University, Dept. of Physics and Astronomy
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Aeronautics
HGF - Program Themes:Propulsion Systems (old)
DLR - Research area:Aeronautics
DLR - Program:L ER - Engine Research
DLR - Research theme (Project):L - Virtual Engine and Validation Methods (old)
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Research > Structural and Functional Ceramics
Deposited By: Müller, Dr.phys. Wolf Eckhard
Deposited On:23 Jan 2006
Last Modified:27 Apr 2009 04:55

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