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Spatial Resolution of the Seebeck Coefficient Measured on Thermoelectric Thin Films

Platzek, Dieter and Karpinski, Gabriele and Stiewe, Christian and Ziolkowski, Pawel and Stordeur, Matthias and Engers, Bernd and Müller, Eckhard (2005) Spatial Resolution of the Seebeck Coefficient Measured on Thermoelectric Thin Films. In: Proc. 3rd European Conf. Thermoelectrics, Ecole des Mines Nancy, FR, 2005, pp. 119-122. ECT 2005 - 3rd European Conf. Thermoelectrics, 2005-09-01 - 2005-09-02, Nancy (FR).

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Abstract

The scanning Seebeck Micro Probe SMP is a tool for measuring the spatial resolution of the Seebeck coefficient. With this heated probe measurement it is possible to detect inhomogeneities of the electrical parameters and even diffusion of dopants in semiconducting or metallic material that cannot be detected with other methods due to the low concentration of the dopants. So far this method is well established for bulk material as already reported. In this paper we describe measurements performed on thin film thermoelectric samples. With this tool information about the thickness of thin films as well as of different layers can be obtained.

Item URL in elib:https://elib.dlr.de/21370/
Document Type:Conference or Workshop Item (Paper, Poster)
Title:Spatial Resolution of the Seebeck Coefficient Measured on Thermoelectric Thin Films
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Platzek, DieterUNSPECIFIEDUNSPECIFIED
Karpinski, GabrieleUNSPECIFIEDUNSPECIFIED
Stiewe, ChristianUNSPECIFIEDUNSPECIFIED
Ziolkowski, PawelUNSPECIFIEDUNSPECIFIED
Stordeur, MatthiasAngaris GmbH, Halle (Saale)UNSPECIFIED
Engers, BerndAngaris GmbH, Halle (Saale)UNSPECIFIED
Müller, EckhardUNSPECIFIEDUNSPECIFIED
Date:2 September 2005
Journal or Publication Title:Proc. 3rd European Conf. Thermoelectrics, Ecole des Mines Nancy, FR, 2005
Refereed publication:No
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:No
Page Range:pp. 119-122
Editors:
EditorsEmail
Lenoir, BertrandUNSPECIFIED
Dauscher, AnneUNSPECIFIED
Status:Published
Keywords:thermoelectric materials, Seebeck Micro Probe, SMP, Seebeck coefficient, spatial resolution, hot probe, inhomogeneity, electrical materials properties, semiconductors, metals, thermoelectric films
Event Title:ECT 2005 - 3rd European Conf. Thermoelectrics
Event Location:Nancy (FR)
Event Type:international Conference
Event Dates:2005-09-01 - 2005-09-02
Organizer:INPL, Ecole des Mines Nancy, FR
HGF - Research field:Aeronautics, Space and Transport (old)
HGF - Program:Aeronautics
HGF - Program Themes:Propulsion Systems (old)
DLR - Research area:Aeronautics
DLR - Program:L ER - Engine Research
DLR - Research theme (Project):L - Virtual Engine and Validation Methods (old)
Location: Köln-Porz
Institutes and Institutions:Institute of Materials Research > Structural and Functional Ceramics
Deposited By: Müller, Dr.phys. Wolf Eckhard
Deposited On:23 Jan 2006
Last Modified:27 Apr 2009 04:54

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