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Coexistence of Thermal Noise and Squeezing in the Intensity Fluctuations of Small Laser Diodes

Hofmann, H. F. and Hess, O. (2000) Coexistence of Thermal Noise and Squeezing in the Intensity Fluctuations of Small Laser Diodes. Journal of the Optical Society of America, B (17), pp. 1926-1933.

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Item URL in elib:https://elib.dlr.de/2108/
Document Type:Article
Additional Information: LIDO-Berichtsjahr=2001,
Title:Coexistence of Thermal Noise and Squeezing in the Intensity Fluctuations of Small Laser Diodes
Authors:
AuthorsInstitution or Email of AuthorsAuthors ORCID iD
Hofmann, H. F.UNSPECIFIEDUNSPECIFIED
Hess, O.UNSPECIFIEDUNSPECIFIED
Date:2000
Journal or Publication Title:Journal of the Optical Society of America
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:No
In ISI Web of Science:Yes
Volume:B
Page Range:pp. 1926-1933
Status:Published
HGF - Research field:Energy
HGF - Program:Aeronautics
HGF - Program Themes:other
DLR - Research area:Energy
DLR - Program:L - no assignment
DLR - Research theme (Project):L - Laser Research and Technology (old)
Location: Stuttgart
Institutes and Institutions:Institute of Technical Physics
Deposited By: DLR-Beauftragter, elib
Deposited On:16 Sep 2005
Last Modified:06 Jan 2010 14:42

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