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Hidden Cost of Circuit Design with RFETs

Parvin, Sajjad and Jha, C. K. and Sill Torres, Frank and Drechlser, R. (2024) Hidden Cost of Circuit Design with RFETs. In: 2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024, pp. 1-2. 2024 Design, Automation & Test in Europe Conference, 2024-03-25 - 2024-03-27, Valencia, Spain. doi: 10.23919/date58400.2024.10546855. ISBN 979-835034859-0. ISSN 1530-1591.

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Abstract

Reconfigurable Field Effect Transistors (RFETs) can be programmed on the fly to behave either as NMOS or PMOS. Digital circuit designs using RFETs have been shown to benefit both in design and security metrics compared to traditional FETs. In this paper, we highlight the problem associated with the cascading of RFET-based logic cells that have their Source(S)/Drain(D) terminals not connected to the supply Voltage(VDD)/Ground(GND). While these circuits occupy a lesser area, there is a drastic increase in the delay of these logic cells when they are cascaded as a result of the S/D being driven by inputs. We then discuss two methods to mitigate this issue using a) buffer insertion for delay minimization, and b) logic cells that have their S/D terminals driven by VDD/GND.

Item URL in elib:https://elib.dlr.de/205117/
Document Type:Conference or Workshop Item (Speech)
Title:Hidden Cost of Circuit Design with RFETs
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Parvin, SajjadUniversität BremenUNSPECIFIEDUNSPECIFIED
Jha, C. K.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Sill Torres, FrankFrank.SillTorres (at) dlr.dehttps://orcid.org/0000-0002-4028-455XUNSPECIFIED
Drechlser, R.UNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Date:2024
Journal or Publication Title:2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:No
DOI:10.23919/date58400.2024.10546855
Page Range:pp. 1-2
ISSN:1530-1591
ISBN:979-835034859-0
Status:Published
Keywords:REFET
Event Title:2024 Design, Automation & Test in Europe Conference
Event Location:Valencia, Spain
Event Type:international Conference
Event Start Date:25 March 2024
Event End Date:27 March 2024
HGF - Research field:other
HGF - Program:other
HGF - Program Themes:other
DLR - Research area:no assignment
DLR - Program:no assignment
DLR - Research theme (Project):no assignment
Location: Bremerhaven
Institutes and Institutions:Institute for the Protection of Maritime Infrastructures > Reslience of Maritime Systems
Deposited By: Sill Torres, Dr. Frank
Deposited On:20 Aug 2024 09:45
Last Modified:23 Jul 2025 12:36

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