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Photon-shot-noise-limited transient absorption soft X-ray spectroscopy at the European XFEL

Guyader, Loic and Eschenlohr, Andrea and Beye, Martin and Schlotter, Wiiliam and Döring, Florian and Carinan, Cammille and Hickin, David and Agarwal, Naman and Boeglin, Christine and Bovensiepen, Uwe and Buck, Jens and Carley, Robert and Castoldi, Andrea and D'Elia, Alessandro and Delitz, Jan-Torben and Ehsan, Wajid and Engel, Robin and Erdinger, Florian and Fangohr, Hans and Fischer, Peter and Fiorini, Carlo and Foehlisch, Alexander and Gelisio, Luca and Gensch, Michael and Gerasimova, Natalia and Gort, Rafael and Hansen, Karsten and Hauf, Steffen and Izquierdo, Manuel and Jal, Emmanuelle and Kamil, Ebad and Kämmerer, Lea and Karabekyan, S. and Kluyver, Thomas and Laarmann, Tim and Lojewski, Tobias and Lomidze, David and Maffessanti, Guiseppe and Mamybayev, Talgat and Marcelli, Augusto and Mercardier, Laurent and Mercurio, Guiseppe and Miedema, Piter and Ollefs, Katharina and Rossnagel, Kai and Rösner, Benedikt and Rothenbach, Nico and Samartsev, Andrey and Schlappa, Justine and Setoodehnia, Kiana and Chiuzbaian, Gheorghe and Stamm, Christian and Stellato, Francesco and Techert, Simone and Teichmann, Martin and Turcato, Monica and Van Kuiken, Benjamin and Wende, Heiko and Yaroslatsev, Alexander and Zhu, Jun and Molodtsov, Serguei and David, Christian and Porro, Matteo and Scherz, Andreas (2023) Photon-shot-noise-limited transient absorption soft X-ray spectroscopy at the European XFEL. Journal of Synchrotron Radiation, 30, pp. 284-300. Wiley. doi: 10.1107/S1600577523000619. ISSN 1600-5775.

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Official URL: https://scripts.iucr.org/cgi-bin/paper?S1600577523000619

Abstract

Femtosecond transient soft X-ray absorption spectroscopy (XAS) is a very promising technique that can be employed at X-ray free-electron lasers (FELs) to investigate out-of-equilibrium dynamics for material and energy research. Here, a dedicated setup for soft X-rays available at the Spectroscopy and Coherent Scattering (SCS) instrument at the European X-ray Free-Electron Laser (European XFEL) is presented. It consists of a beam-splitting off-axis zone plate (BOZ) used in transmission to create three copies of the incoming beam, which are used to measure the transmitted intensity through the excited and unexcited sample, as well as to monitor the incoming intensity. Since these three intensity signals are detected shot by shot and simultaneously, this setup allows normalized shot-by-shot analysis of the transmission. For photon detection, an imaging detector capable of recording up to 800 images at 4.5 MHz frame rate during the FEL burst is employed, and allows a photon-shot-noise-limited sensitivity to be approached. The setup and its capabilities are reviewed as well as the online and offline analysis tools provided to users.

Item URL in elib:https://elib.dlr.de/202454/
Document Type:Article
Title:Photon-shot-noise-limited transient absorption soft X-ray spectroscopy at the European XFEL
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Guyader, LoicEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Eschenlohr, AndreaUniversität Duisburg-EssenUNSPECIFIEDUNSPECIFIED
Beye, MartinDESYUNSPECIFIEDUNSPECIFIED
Schlotter, WiiliamLCLSUNSPECIFIEDUNSPECIFIED
Döring, FlorianDESYUNSPECIFIEDUNSPECIFIED
Carinan, CammilleEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Hickin, DavidEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Agarwal, NamanEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Boeglin, ChristineUniversität StraßburgUNSPECIFIEDUNSPECIFIED
Bovensiepen, UweUniversität DuisburgUNSPECIFIEDUNSPECIFIED
Buck, JensDESYUNSPECIFIEDUNSPECIFIED
Carley, RobertEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Castoldi, AndreaPolitecnico di MilanoUNSPECIFIEDUNSPECIFIED
D'Elia, AlessandroIOM-CNR,UNSPECIFIEDUNSPECIFIED
Delitz, Jan-TorbenEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Ehsan, WajidEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Engel, RobinDESYUNSPECIFIEDUNSPECIFIED
Erdinger, FlorianMax-Planck Institute for the Structure and Dynamics of MatterUNSPECIFIEDUNSPECIFIED
Fangohr, HansEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Fischer, PeterUniversity of HeidelbergUNSPECIFIEDUNSPECIFIED
Fiorini, CarloPolitecnico di MilanoUNSPECIFIEDUNSPECIFIED
Foehlisch, AlexanderHZBUNSPECIFIEDUNSPECIFIED
Gelisio, LucaEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Gensch, MichaelUNSPECIFIEDhttps://orcid.org/0000-0001-7755-1618152090956
Gerasimova, NataliaEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Gort, RafaelEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Hansen, KarstenDESYUNSPECIFIEDUNSPECIFIED
Hauf, SteffenEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Izquierdo, ManuelEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Jal, EmmanuelleSorbonne UniversiteUNSPECIFIEDUNSPECIFIED
Kamil, EbadEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Kämmerer, LeaUniversität Duisburg-EssenUNSPECIFIEDUNSPECIFIED
Karabekyan, S.European XFEL GmbHUNSPECIFIEDUNSPECIFIED
Kluyver, ThomasEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Laarmann, TimDESYUNSPECIFIEDUNSPECIFIED
Lojewski, TobiasUniversität Duisburg-EssenUNSPECIFIEDUNSPECIFIED
Lomidze, DavidEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Maffessanti, GuiseppeDESYUNSPECIFIEDUNSPECIFIED
Mamybayev, TalgatPSIUNSPECIFIEDUNSPECIFIED
Marcelli, AugustoINFN – Laboratori Nazionali di FrascatiUNSPECIFIEDUNSPECIFIED
Mercardier, LaurentEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Mercurio, GuiseppeEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Miedema, PiterEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Ollefs, KatharinaUniversität Duisburg-EssenUNSPECIFIEDUNSPECIFIED
Rossnagel, KaiKiel UniversityUNSPECIFIEDUNSPECIFIED
Rösner, BenediktPSIUNSPECIFIEDUNSPECIFIED
Rothenbach, NicoUniversität Duisburg-EssenUNSPECIFIEDUNSPECIFIED
Samartsev, AndreyEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Schlappa, JustineEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Setoodehnia, KianaEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Chiuzbaian, GheorgheSorbonne UniversiteUNSPECIFIEDUNSPECIFIED
Stamm, ChristianETH Zuerich,UNSPECIFIEDUNSPECIFIED
Stellato, FrancescoUniversity of Rome Tor VergataUNSPECIFIEDUNSPECIFIED
Techert, SimoneDESYUNSPECIFIEDUNSPECIFIED
Teichmann, MartinEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Turcato, MonicaEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Van Kuiken, BenjaminEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Wende, HeikoUniversität Duisburg-EssenUNSPECIFIEDUNSPECIFIED
Yaroslatsev, AlexanderEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Zhu, JunEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Molodtsov, SergueiEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
David, ChristianPSIUNSPECIFIEDUNSPECIFIED
Porro, MatteoEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Scherz, AndreasEuropean XFEL GmbHUNSPECIFIEDUNSPECIFIED
Date:January 2023
Journal or Publication Title:Journal of Synchrotron Radiation
Refereed publication:Yes
Open Access:Yes
Gold Open Access:Yes
In SCOPUS:Yes
In ISI Web of Science:Yes
Volume:30
DOI:10.1107/S1600577523000619
Page Range:pp. 284-300
Publisher:Wiley
ISSN:1600-5775
Status:Published
Keywords:Röntgenstrahlung, Sensorik, Röntgenlaser
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Robotics
DLR - Research area:Raumfahrt
DLR - Program:R RO - Robotics
DLR - Research theme (Project):R - spectroscopy methodology
Location: Berlin-Adlershof
Institutes and Institutions:Institute of Optical Sensor Systems > Terahertz and Laser Spectroscopy
Deposited By: Gensch, Michael
Deposited On:01 Feb 2024 07:43
Last Modified:06 Feb 2024 11:13

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