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Enhanced Fault Classification and Localization in Microgrids Using Machine Learning

Jayasinghe, J.A.R.R. and Malindi, J.H.E. and Rajapaksha, R.M.A.M. and LOGEESHAN, V. and Rajakaruna Wanigasekara, Chathura (2023) Enhanced Fault Classification and Localization in Microgrids Using Machine Learning. In: 2023 IEEE World AI IoT Congress, AIIoT 2023. IEEE. 2023 IEEE World AI IoT Congress (AIIoT), 2023-06-07 - 2023-06-10, Seattle, WA, USA. doi: 10.1109/AIIoT58121.2023.10174440. ISBN 979-835033761-7.

Full text not available from this repository.

Official URL: https://ieeexplore.ieee.org/document/10174440

Abstract

The identification and positioning of faults are crucial in microgrids to enhance their performance and control. However, conventional protection methods are not effective due to significant variations in fault currents caused by diverse operational scenarios in microgrids. Additionally, they cannot locate the fault. Thus, the authors propose a deep learning-based system that uses discrete wavelet transform, wavelet energy entropy, and artificial neural networks to classify and locate the faults in the distribution network of the microgrid. The system is designed to quickly isolate the fault and restore power supply. MATLAB/Simulink is used to simulate the microgrid and train the neural networks. The study shows that the proposed system achieves high accuracy in fault classification and localization within a short period.

Item URL in elib:https://elib.dlr.de/196226/
Document Type:Conference or Workshop Item (Lecture)
Title:Enhanced Fault Classification and Localization in Microgrids Using Machine Learning
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Jayasinghe, J.A.R.R.University of MoratuwaUNSPECIFIEDUNSPECIFIED
Malindi, J.H.E.University of MoratuwaUNSPECIFIEDUNSPECIFIED
Rajapaksha, R.M.A.M.University of MoratuwaUNSPECIFIEDUNSPECIFIED
LOGEESHAN, V.University of MoratuwaUNSPECIFIEDUNSPECIFIED
Rajakaruna Wanigasekara, ChathuraChathura.Wanigasekara (at) dlr.dehttps://orcid.org/0000-0003-4371-6108143015319
Date:July 2023
Journal or Publication Title:2023 IEEE World AI IoT Congress, AIIoT 2023
Refereed publication:Yes
Open Access:No
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:No
DOI:10.1109/AIIoT58121.2023.10174440
Publisher:IEEE
ISBN:979-835033761-7
Status:Published
Keywords:artificial neural network (ANN), discrete wavelet transform (DWT), fault detection, fault localization, microgrid.
Event Title:2023 IEEE World AI IoT Congress (AIIoT)
Event Location:Seattle, WA, USA
Event Type:international Conference
Event Start Date:7 June 2023
Event End Date:10 June 2023
HGF - Research field:other
HGF - Program:other
HGF - Program Themes:other
DLR - Research area:no assignment
DLR - Program:no assignment
DLR - Research theme (Project):no assignment
Location: Bremerhaven
Institutes and Institutions:Institute for the Protection of Maritime Infrastructures > Reslience of Maritime Systems
Deposited By: Rajakaruna Wanigasekara, Chathura
Deposited On:26 Sep 2023 09:36
Last Modified:27 May 2024 12:42

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