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Broadband Effective Permittivity Simulation and Measurement Techniques for 3D-Printed Dielectric Crystals

Hehenberger, Simon Philipp and Caizzone, Stefano and Thurner, Stefan and Yarovoy, Alexander (2023) Broadband Effective Permittivity Simulation and Measurement Techniques for 3D-Printed Dielectric Crystals. IEEE Transactions on Microwave Theory and Techniques, pp. 1-12. IEEE - Institute of Electrical and Electronics Engineers. doi: 10.1109/TMTT.2023.3259479. ISSN 0018-9480.

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Official URL: https://ieeexplore.ieee.org/abstract/document/10089204

Abstract

3D-printed structured dielectrics, or dielectric crystals, with engineered effective permittivity, are currently receiving much research attention to create novel graded index devices for micro- and mmWave applications. However, the design, modeling, and experimental verification of the dielectric properties of such crystals are not trivial. Promising results have been achieved using parametrically defined unit cells, effective media theories (EMT), and resonative measurement setups. However, more generalized design approaches and sophisticated simulation and measurement methods that provide insight into frequency-dependent behavior are needed to fully expoint the potential of structured dielectrics. This work discusses the plane wave expansion method (PWEM), Flochet port simulations, and traveling wave measurements in both guided and free-space setups to address the shortcomings of effective media theories like the Maxwell-Garnett approximation (MGA) and resonative measurement methods. Furthermore, a generalized design method for the dielectric crystals is utilized to create unit cells with different crystal symmetries. Results of the individual simulation and measurement setups are discussed concerning dielectric crystals in simple cubic (SC) and face-centered cubic (FCC) symmetry with different unit cell sizes and volumetric infill fractions. PWEM and Flochet port simulations and traveling wave measurements show excellent agreement for the extracted effective permittivity of structured dielectrics. Furthermore, the discussed methods predict and measure frequency-dependent effects that are not covered by effective media theories and resonative measurement setups, highlighting the necessity to adopt more sophisticated simulation tools for the design of graded index devices.

Item URL in elib:https://elib.dlr.de/189717/
Document Type:Article
Title:Broadband Effective Permittivity Simulation and Measurement Techniques for 3D-Printed Dielectric Crystals
Authors:
AuthorsInstitution or Email of AuthorsAuthor's ORCID iDORCID Put Code
Hehenberger, Simon PhilippUNSPECIFIEDhttps://orcid.org/0000-0003-3816-3641146033363
Caizzone, StefanoUNSPECIFIEDhttps://orcid.org/0000-0002-9434-7368UNSPECIFIED
Thurner, StefanUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Yarovoy, AlexanderUNSPECIFIEDUNSPECIFIEDUNSPECIFIED
Date:30 March 2023
Journal or Publication Title:IEEE Transactions on Microwave Theory and Techniques
Refereed publication:Yes
Open Access:Yes
Gold Open Access:No
In SCOPUS:Yes
In ISI Web of Science:Yes
DOI:10.1109/TMTT.2023.3259479
Page Range:pp. 1-12
Publisher:IEEE - Institute of Electrical and Electronics Engineers
Series Name:IEEE Transactions on Microwave Theory and Techniques
ISSN:0018-9480
Status:Published
Keywords:3D-Print; Dielectric crystal; Strucutred dielectric; effective permittivity; measurement; simulation; material characterization;
HGF - Research field:Aeronautics, Space and Transport
HGF - Program:Space
HGF - Program Themes:Communication, Navigation, Quantum Technology
DLR - Research area:Raumfahrt
DLR - Program:R KNQ - Communication, Navigation, Quantum Technology
DLR - Research theme (Project):R - Project Navigation 4.0
Location: Oberpfaffenhofen
Institutes and Institutions:Institute of Communication and Navigation > Navigation
Microwaves and Radar Institute > Reconnaissance and Security
Deposited By: Hehenberger, Simon Philipp
Deposited On:21 Apr 2023 15:26
Last Modified:04 Dec 2023 10:50

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